Chroma ATE Inc., a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems, Turnkey Test and Automation Solutions will present its newest semiconductor test solution for the IoT IC market in SEMICON Taiwan in September.
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
▲ Chroma 3680 Advanced SoC Test System
Newly developed this year, the Chroma 33010 PXIe Digital IO Card provides automatic test functions based on PXIe architecture to excel in the heavy demands of PXI testing. To satisfy smaller IC channels and increasingly complex test functions especially on IoT and automotive electronics IC, the PXI/PXIe architecture in semiconductor testing offers unparalleled advantage in diversity and flexibility, which includes MCU, MEMS, RF IC and PMIC testing. It can also be ported to Chroma 3380D (256 channels) and Chroma 3380P (512 channels) for mass production
▲ Chroma 33010 PXIe Digital IO card
The Chroma 3260 Automatic System Function Tester is suitable for PCB level parallel tests on multiple mass production equipment that can accommodate various types of package (QFP, TQFP, μBGA, PGA and CSP) with active thermal control under high temperature ranging from 50°C to 125°C to test 1 to 6 test sockets. Chroma also has a Tri-temperature SLT Handler operates with excellent temperature performance ranging from -40°C to 125°C. Applications include IC components for IoV (Internet of Vehicle) and cloud-computing industry.
Chroma’s semiconductor test solution also provides a variety of software suites for different testing applications.
SEMICON Taiwan will be held from Sept. 13 to 15, 2017, and Chroma ATE Inc. will show the newest semiconductor test solution at the Nangang Exhibition Center Hall 1 (Booth No. 1616). We invite you to experience new trends in test and measurement, and look forward to meeting you at this annual event.