Chroma ATE Inc.

Passive Component Test Solution Selectrion Guides
Passive Component Test Solution Selectrion Guides

LCR Meter

ModelFrequency RangeImpedance RangeDescription
11020 100Hz, 120Hz, 1kHz 0.1pF ~ 4.00 F High speed capacitance inspection Read More!
11021 100Hz, 120Hz, 1kHz, 10kHz 0.1mΩ ~ 100MΩ Digital bin-sorting and comparator functions, up to 1kHz only optional Read More!
11021-L 1kHz, 10kHz, 40kHz, 50kHz 0.1mΩ ~ 100MΩ Digital bin-sorting and comparator functions
Read More!
11022

50/60/100/120/1k/10k/
20k/40k/50k/100k Hz

0.01mΩ ~ 100MΩ

Digital high speed measurement in all test frequencies,
excellent low-impedance measurement accuracy,
bin-sorting and comparator functions 

Read More!
11025

50/60/100/120/1k/10k/
20k/40k/50k/100k Hz

0.01mΩ ~ 100MΩ Identical Model 11022, and add transformer testing function Read More!
11050 1kHz~10MHz 0.1mΩ ~ 100MΩ wide range test frequency, high speed measurement, and excellent accuracy Read More!
11050-5M 60Hz~5MHz 0.1mΩ ~ 100MΩ wide range test frequency, high speed measurement, and excellent accuracy Read More!
1062A 40Hz~200kHz, 30 points 0.01mΩ ~ 100MΩ Excellent low impedance measurement accuracy and comparator function Read More!
1075 20Hz~200kHz 0.01mΩ ~ 100MΩ Excellent low impedance measurement accuracy and comparator function Read More!
3252 20Hz~200kHz 0.1mΩ ~ 100MΩ LCR + transformer testing and frequency characteristics analysis function Read More!
3302 20Hz~1MHz 0.1mΩ ~ 100MΩ Built-in 1A/8mA bias current source optional
Identical Model 3252 1MHz edition
Read More!

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Auto Transformer Test System

ModelFrequency RangeImpedance RangeDescription
13350+A133502 20Hz ~ 200kHz 0.1mΩ ~ 100MΩ

Transformer L/C/Z/DCR/Turns-ratio/Pin-short/
Balance scanning test function

Read More!
3250+A132501 20Hz ~ 200kHz 0.1mΩ ~ 100MΩ

Transformer L/C/Z/DCR/Turns-ratio/Pin-short/
Balance scanning test function

Read More!
3252+A132501 20Hz ~ 200kHz 0.1mΩ ~ 100MΩ Identical Model 3250 and add LCR Meter function Read More!
3302+A132501

20Hz ~ 1MHz

0.01mΩ ~ 100MΩ

Identical Model 3252 1MHz edition

Read More!
3312+A132501

20Hz ~ 1MHz

0.01mΩ ~ 100MΩ Identical Model 3302 and add Telecom parameter measurement function Read More!

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Bias Current Source / Test System 

ModelFrequency RangeImpedance RangeDescription
1310 20Hz ~ 200kHz 0~10A

Economic type

Read More!
1320 20Hz ~ 1MHz 0~20A

Programmable, and also can be controlled by Chroma 3252/3302
combined with Chroma 1320 to extend drive current

Read More!
1320S 20Hz ~ 1MHz 0~20A Slave (1320) Read More!
1320-10A

20Hz ~ 1MHz

0~10A

Identical 1320 10A edition, mainly used in PFC choke testing which higher
DC resistance and the DC voltage dropped exceeds 6V

Read More!
11300

20Hz ~ 1MHz

0~300A

Intergration of 1320S with LCR Meter for large bias current testing
of power choke

Read More!

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Automatic Test System

ModelFrimary FunctionTest SignalDescription
1810

Magnetic Component
Test System

DC Bias Current 60A max.
HF AC Voltage 20kHZ~1MHZ

Economic type

Read More!
1820 Capacitor Test System

DC Bias Voltage 3kV max.
HF AC Current 10kHz~200kHz

Film Capacitor

Read More!
1870D
1870D-12 
Inductor Test & Packing Machine

Polarity test/Layer short test/BIAS current test/
Hipot test/ DCR test/LsQ test

Testing and packing for Chip inductor Read More!
1871

Inductor Layer Short ATS

5 tests simultaneously /2 test simultaneously

Layer short testing and sorting for Chip inductor

Read More!
8800

Component ATS

L/C/R/Z/DCR/Turns-ratio/
Insulation Resistance (IR)

For RJ-45 equipment
(including LAN Modules, Ethernet IC, PoE IC, etc.),
glass substrate, LCD glass substrate,
printed circuit glass (including touch panel, etc),
PCB, EMI filter and ICT applications

Read More!
8801

EDLC ATS

C (DC), internal resistance (DC), ESR (AC)

For Electrical Double Layer Capacitor on
production lines

Read More!
8802 EDLC LC Monitoring System Leakage Current (LC)

For Electrical Double Layer Capacitor on
production lines

Read More!

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