Model
3360-D
VLSI Test System
The Best Lab Tool
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Key Features
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- 50 MHz Test Rate
- 16 ~ 64 I/O channels
- 8M Pattern Memory
- Flexible Configuration
- Parallel Testing : max 2 devices
- Real Parallel Trim/Match function
- Timing / Frequency measurement unit (TFMU)
- Test program/pattern converter (V7, V50, SC312, J750)
- Analog PE card option (16 bits)
- SCAN test option (512M)
- ALPG test option for Memory
- STDF tools support (Option)
- User friendly Windows XP environment
- CRAFT C/C++ programming language
- Real time pattern editor with fail pin/fail address display
- Versatile test analysis tools : Shmoo plot, Waveform display, Wafer Map, Pin Margin, Scope tool, Histogram tool and etc.
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The Full Application Functions – Logic, ADDA, LCD, LED, Power, ALPG, Match⋯etc
3360-D Bridge Test Development to Mass-Production
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Request a quote.
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All specifications are subject to change without notice
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