VLSI Test System Model 3380D
- 50/100 MHz clock rate
- 50/100 Mbps data rate
- 256 logic I/O pins (max. 576 pins)
- Up to 256 sites parallel test
- 32/64/128M pattern memory
- Various VI source
- Flexible HW-architecture (Interchangeable I/O, VI, ADDA,)
- Real parallel trim/match function
- Time & Frequency Measurement Unit (TFMU)
- AD/DA test (16/24bits option)
- SCAN test option (max. 2G M/chain)
- ALPG test option for embedded memory
- STDF tools support
- Test program/pattern converter (J750, D10, S50, E320, SC312, V7, TRI-6020)
- Direct mount probe card is compatible with 3360P direct mount probe card
- Cable mount DUT card is compatible with 3360D/3360P cable mount DUT card (FT/CP)
- CRAFT C/C++ programming language
- Software is compatible with 3360/3360P
In order to cope with the IC testing trend of highspeed, numerous pins and complex functions in the future, the newest generation of Chroma's VLSI testers, 3380D/3380P/3380, have adopted a more flexible architecture with higher integration density and powerful functions.
The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
The test systems also have built in DC power rack design to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.
The 3380D will be ideally for IoT applications, especially for those cost sensitive devices such as MCU, MEMS, and MCU with integrated functions. The VLSI test systems, including the 3380D/3380P/3380 series, have been widely adopted in China market.
Full Applications to meet veried ICs such as Logic, ADDA, RF(MCU), LED, Power, ALPG, Match, etc.
Compatible Kits Solutions
3380D C-M FT/CP solution - The cable mount kits are compatible with 3360D/3360P cable mount FT/CP
3380D D-M CP solution - The direct mount kits are compatible with 3360P/3380P D-M probe card