Chroma 7930 LED die inspection system is an automatic inspection system for textured and non-textured LED die wafer. The appearance feature of LED die and defects on it are clearly conspicuous by using advanced illumination technology. Illumination and camera shot mode can be adjusted for the different type of LED die.
Applied with high speed camera and inspection algorithms, Chroma 7930 can inspect a 2’ wafer within 3.5 minutes and the number of die chips is around 12000 die chips (calculated base on size of 250um x 550um). Chroma 7930 also provides auto focus and tilts compensation function to overcome wafer/chunk leveling issue.
After the tape expansion process , the arrangement of dies on wafer may be formed an irregular alignment. Chroma 7930 offers a unique software alignment function to mapping the wafer file from LED tester. And add inspection results to generate a new wafer file for sorting process.
In addition, Chroma 7930 owns a friendly user interface to reduce user’s learning time. All of inspection information are visualized for easy reading, like mapping map, Interactive edit window.
In conclusion, Chroma 7930 is an ideal cost and performance selection for LED die process.