Model 3650-EXModel 3650Model 3650-CX
Key Features Key Features Key Features
  • 50/100MHz Clock Rate
  • Maximum 1024 I/O Pins
  • 32/64M Pattern Memory
  • Maximum 96 CH DPS
  • SCAN / ALPG Function
  • 512 DUT Parallel Test
  • Microsoft Windows®7/XP OS
  • 50/100MHz Clock Rate
  • Maximum 640 I/O Pins
  • 16/32M Pattern Memory
  • Maximum 32 CH DPS
  • SCAN / ALPG Function
  • 32 DUT Parallel Test
  • Microsoft Windows®7/XP OS
  • 50/100MHz Clock Rate
  • Maximum 256 I/O Pins
  • 16/32M Pattern Memory
  • Maximum 16 CH DPS
  • SCAN / ALPG Function
  • 32 DUT Parallel Test
  • Microsoft Windows®7/XP OS

 

SoC Test System

Chroma semiconductor ATE is specifically designed for high-throughput and high parallel test capabilities to provide the most costeffective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, it is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.