Visual Inspection System

In recent years, the cost control of silicon wafer is down followed by the reduced price, the reduction of test cost ratio is gradually focused on instead. The VLSI test system can simulate the logic IC's electric signals precisely and interpret the test results rapidly. The expansion of Test Head is capable of executing multiple test programs for massive multi sites to improve the throughput. In addition, the customized test device can replace the general purpose tester to fit in the specified requirements directly that can actually meet the goal of reducing test cost.

Applications in IC Wafer Backend Process

In the back end of IC process, handlers are used to sort the products with different types of package. After package testing, the Automatic System Function Tester, which tests IC in a real environment instead of simulation by IC testers, are used for tests of complicated IC with high fault coverage and low cost and highly improves test quality.