Model 3380Model 3380-P, 3380-DModel 3360-P, 3360-D
Key Features Key Features Key Features
  • 50/100MHz Clock Rate
  • Max. 1280 I/O Pins
  • 32/64/128M Pattern Memory
  • Max. 128 CH DPS (4 wires)
  • SCAN / ALPG Function
  • 1024 DUT Parallel Test
  • Microsoft Windows® 7 OS
  • Flexible configuration
  • 50/100MHz Clock Rate
  • Max. 576 I/O Pins (256 for 3380-D)
  • 32/64/128M Pattern Memory
  • Max. 64 CH DPS (4 wires)
  • SCAN / ALPG Function
  • 512 DUT Parallel Test (256 for 3380-D)
  • Microsoft Windows® 7 OS
  • Flexible configuration
  • 50 MHz Clock Rate
  • Max. 256 I/O Pins (64 for 3360-D)
  • 8/16M Pattern Memory
  • Flexible configuration
  • SCAN / ALPG Function
  • 32 DUT Parallel Test
  • Microsoft Windows® 7 /XP OS

 

VLSI Test System

Chroma semiconductor ATE is specifically designed for high-throughput and high parallel test capabilities to provide the most costeffective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, it is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.