In the design of 7202, Chroma come out a unique optical design that ensures the result of grain-size calculation is highly repetitive. Since the classication of different grain-size could be quantified, the inspected wafers can be applied to the proper cell manufacturing lines to get highest possible cell eciency.
Pinhole defect can also be detected by 7202. The pinhole defect is known to be cause of μ-crack or severe local shunting that will lead to reliability issue to the PV module.
▲ Analysis of pinhole defect
- Capable to be integrated to any wafer sorters
- Flexible algorithms editor for mono-crystalline, multi-crystalline and quasi-crystalline wafers, and works for both 5" and 6"
- Multiple interface to communicate with different equipment or manufacturing execution system(MES)
- Unique illumination design to ensure the repeatability of grain-size
▲ Examples of the grain-size inspection result on 7202