Signal Generator Card Model A270149

Key Features
  • Support eDP to enter BIST mode for signal setting
  • Provide VDD, VBL power setting
  • Provide VDD, VBL over current protection
  • Integrate with PG Master software for parameters setting

The eDP BIST module design is based on the requirements of GIS Chengdu factory that can provide panel the required signal and power when entering in BIST mode. It can offer a complete eDP panel aging test solution when integrated with Chroma aging system. The module adopts drawer type stack architecture that each rack can perform multiple burn in tests through the controller. When the module is integrated with electronic control, signals, and a user friendly operating interface, it can perform the most powerful function tests in a short time.

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All specifications are subject to change without notice.

eDP BIST Module