Quick Menu

先进SoC/模拟测试系统
先进SoC/模拟测试系统
Model 3680
  • 24个可互换插槽,用于数字、模拟和混合信号应用
  • 150 Mbps数据速率(muxed模式最高最高1Gbps)
  • 最高512 sites并行测试
  • 多达2048个数字通道管脚
SoC/Analog测试系统
SoC/Analog 测试系统
Model 3650
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer 
  • Expandable platform with up to 640 channels
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
SoC/Analog测试系统
SoC/Analog 测试系统
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX
SoC/Analog测试系统
SoC/Analog 测试系统
Model 3650-CX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 256 channels
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA