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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.

SoC 测试系统

SoC/模拟测试系统 Model3650-S2
Model 3650-S2
  • 12个通用插槽,全部插槽都可配置数字、模拟和混合信号集成电路测试单板使用
  • 多达768个数字和模拟测试通道
  • 时钟频率: 50 / 100 MHz
  • 数据速率: 100 / 200 Mbps (MUX)
无线射频功能单板 HDRF2
  • 4 VST, 32射频端口
  • 精准稳定Direct Mount连接方式
  • 8/16 Sites测试
  • Wi-Fi、BT、Sub 6GHz、IOT、GPS、LoRa、NB-IoT
先进SoC测试系统 Model3680
Model 3680
  • 24个可互换插槽,用于数字、模拟和混合信号应用
  • 最高1Gbps数据速率
  • 最高2048 sites并行测试
  • 多达2048个数字通道管脚
SoC/Analog测试系统 Model3650
SoC/Analog 测试系统
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
SoC/Analog测试系统 Model3650-EX
SoC/Analog 测试系统
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX