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Chroma's IC test and handler solutions assure that the IC packaging meets the original design specifications and verify the performance of the IC before it is assembled in the electronic product. The pick-and-place IC handler can be used in the system-level test and final test for all sorts of ICs. Working with a tri-temp controller enables simulation of use in a harsh environment under extremely low and high temperatures. Combined with various automated designs, Chroma's IC handler can meet all your testing needs. Chroma Virtual Operation Tools can remotely monitor the test process, predict the handler's test efficiency through big data, and improve your product's test yield.

IC测试分类机 (IC Test Handler)

SingleSiteTestHandler Model3210
Single Site Test Handler
Model 3210
  • SLT handler 
  • Ideal for early device design and engineering validation
  • Compatible kit to scale-up production
  • ATC Tri-temp -40℃ to 150℃ IC test
双用单站测试分类机 Model3110
Model 3110
  • FT and SLT compatible handler 
  • Compatible kit to scale-up production
  • ATC Tri-temp -40 to 150 ℃ IC test (Optional -55 to 150℃ , -70 to 150℃)
  • Auto tray loading/unloading and device sorting capability
三温测试分类机 Model3110-FT
  • CE Mark
Model 3110-FT
  • Temperature Test from -40~125℃
  • Final Test or System Level Test
  • 3x3mm~45x45mm Package
桌上型单站测试分类机 Model3111
  • CE Mark
Model 3111
  • 桌上型设计仅占较小空间
  • 可放置两个JEDEC料盘
  • 支持5x5mm到45x45mm芯片尺寸
  • 可由软件接口设定分类数
  • 测试头内建气室,可吸收及减缓下压触力冲击
无线射频分类机 Model3240-Q
Model 3240-Q
晶片测试分类机 Model3112
Model 3112
三温终端测试分类机 3160-C
  • CE Mark
  • 先进的温控技术(Nitro-TEC 氮气温度控制器)
  • 更快的Index Time(0.6 sec)
  • 主动式温度控制并且提供更全面的测试温度区间
  • Chamber Less的设计
  • 支持更多样化测试Sites的选择(1/2/4 sites)
八站逻辑测试分类机 Model3180
  • CE Mark
Model 3180
  • 具有八个平行测试站点
  • 9Kpcs产能
  • 温度测试范围从常温到高温150℃
三温系统板测试分类机 Model3260C
Model 3260C
  • 高速可靠Pick&Place分类机
  • 同步吸嘴双取与双放设计
  • IC残留检测功能、通用治具设计
  • Nitro TEC主动式温控技术导入
  • 更快速的升降温反应速度
自动化系统功能测试机 Model3240
Model 3240
  • 4-sites
  • 可供多组PCB level平行测试的大量生产机具
自动化系统功能测试机 Model3260
Model 3260
  • 6-sites
  • 可供多组PCB level平行测试的大量生产机具
微型IC测试分类机 Model3270
Model 3270
适合CMOS 影像感应元件 (CMOS Image Sensor, CIS)量产所需
TemperatureForcingSystem Model31000RSeries
Temperature Forcing System
Model 31000R Series
  • -70°C to 150°C temperature range
  • Cost competitive
  • Compact footprint
  • Semi-automation
  • Liquid-free Operation