Quick Menu

Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.

VLSI 测试系统

VLSI测试系统 Model3380P
VLSI 测试系统
Model 3380P
  • 50/100 MHz测试频率、50/100 Mbps数据速率
  • 512数字信道管脚 (最高可至 576数字信道管脚)
  • 并行测试可达512 sites同测数
  • 多样弹性VI电源
VLSI测试系统 Model3380D
VLSI 测试系统
Model 3380D
  • 50/100 MHz测试频率、50/100 Mbps数据速率
  • 256数字信道管脚
  • 并行测试可达256 sites同测数
  • 多样弹性VI电源
VLSI测试系统 Model3380
VLSI 测试系统
Model 3380
  • 50/100 MHz测试频率、50/100 Mbps数据速率
  • 1024 I数字信道管脚 (最高1280 数字信道管脚)
  • 高达1024 sites并行测试
HighVoltageDevicePowerSupply Model33021
  • PXI Systems Alliance
High Voltage Device Power Supply
Model 33021
  • Max. 48V DC output with 2 channels per card
UniversalRelayDriverControl Model33011
  • PXI Systems Alliance
Universal Relay Driver Control
Model 33011
  • PXIe based universal relay control
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
HighSpeedPXIeDigitalIOCard Model33010
  • PXI Systems Alliance
High Speed PXIe Digital IO Card
Model 33010
  • Standard PXIe bus connector
  • 100MHz maximum clock rate
  • 32 channels per board