As the technology of optoelectronic components is maturing, its applications are broadening as well. Take laser diodes for example, they are no longer limited to communication applications but have expanded into consumer products. Photonics test solutions mainly focus on testing optoelectronic components, such as photodiode, LED, EEL, and VCSEL. They can also apply to configurations from upstream to downstream processes, including wafer, laser bar, bare chip, CoS, and TO-CAN. Chroma's system integration technology uniquely combines automation equipment with precision current sources, temperature controllers, and automated optical measurement instruments to perform an array of electrical, optical power, wavelength, near-field and far-field optics, and other optoelectronic characteristic and aging tests.

Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often integrated into production solutions for wafer probe test, burn-in and device or module characterization then reinforced with inspection, metrology, robotics, Industry 4.0 and more.

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制程中芯片外观检查系统 Model7945
  • CE Mark
Model 7945
  • 双面检测(切割后芯片)
  • 异色缺陷检测
  • 支持多计算机检测以缩短处理时间
  • 可共享自动进料机设计
光电组件晶圆点测系统 Model58635Series
Model 58635 Series
  • 依据ISO/IEC标准
  • 最大可测试6吋晶圆
  • 宽广的测试范围与高精准温度控制
晶圆检测系统 Model7940
Model 7940
  • 可同时检测正反两面晶圆
  • 最大可检测6吋扩膜晶圆(检测区域达8吋范围 )
  • 可因应不同产业的晶粒更换或新增检测项目
  • 上片后晶圆自动对位机制


光电元件模组多功能测试系统 Model58625
Model 58625
  • 多合一整合型测试机
  • 可弹性安排多种测试站
  • 具精准之温度平台控制能力
  • 温控范围可达-20~85℃
  • 光学模组可支援大角度之发光角量测
光电二极体烧机及可靠度测试系统 Model58606
Model 58606
  • 提供可靠度测试、寿命测试与老化测试
  • 暗电流量测与崩溃电压量测
  • 每层模组提供256个四象限SMU通道
  • 每通道最高可达80V
雷射二极体烧机及可靠度测试系统 Model58604
  • CE Mark
Model 58604
  • 可提供烧机测试,信赖性测试与老化测试
  • 支持自动电流控制模式(ACC)与自动功率控制模式(APC)
  • 个别通道驱动与量测/可供应达500mA的电流
  • 达125℃的精确温度控制
  • 个别模组独立操作
激光半导体特性测试机 Model58620
Model 58620
  • 全自动化检测边射型激光二极管芯片
  • 高精密及高容量载具设计、TEC温度控制稳定度达0.01℃
  • Auto-alignment设计,AOI 辅助定位
  • 共用载具设计可搭配烧机测试
LaserDiodeReliability,Burn-InandLife-TestSystem Model58602
Laser Diode Reliability, Burn-In and Life-Test System
Model 58602
  • Burn-In, Reliability and Life Testing
  • Up to 4608 Channels
  • Up to 20A per device
TO-CAN/CoC烧机测试系统 Model58603
TO-CAN/CoC 烧机测试系统
Model 58603
  • 可提供烧机测试、信赖性测试与寿命测试
  • 每个系统可提供高达10个模组测试
  • 支援自动电流控制模式(ACC)与自动功率控制模式(APC)
TO-CAN封装外观检测系统 Model7925
TO-CAN 封装外观检测系统
Model 7925
  • 可检测TO-CAN 封装金属外盖与透镜之刮伤、破裂、异物及胶合不良等缺陷
  • 检测完成后可依设定规格挑拣不良品
  • 每小时最高可检测3600颗待测物