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Sistemi di test SoC

AdvancedSoC/AnalogTestSystem Model3680
  • Taiwan Excellence 2022
Advanced SoC/Analog Test System
Model 3680
  • 24 interchangeable slots for digital, analog and mixed-signal applications
  • 150 Mbps up to 1Gbps data rate (muxed)
  • Up to 512 sites parallel test
  • Up to 2048 digital I/O pins
AdvancedSoC/AnalogTestSystem Model3650
Advanced SoC/Analog Test System
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
AdvancedSoC/AnalogTestSystem Model3650-EX
Advanced SoC/Analog Test System
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX

Sistemi di test VLSI

VLSITestSystem Model3380P
VLSI Test System
Model 3380P
  • 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
  • Up to 512 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSITestSystem Model3380D
VLSI Test System
Model 3380D
  • 100 MHz clock rate, 256 I/O digital I/O pins
  • Up to 256 sites Parallel testing
  • Various VI source
  • Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSITestSystem Model3380
VLSI Test System
Model 3380
  • 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
  • Up to 1024 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
UniversalRelayDriverControl Model33011
  • PXI Systems Alliance
Universal Relay Driver Control
Model 33011
  • PXIe based universal relay control
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
SchedaIOdigitalePXIeadaltavelocità Model33010
  • PXI Systems Alliance
Scheda IO digitale PXIe ad alta velocità
Model 33010
  • Connettore bus PXIe standard
  • Frequenza massima di clock di 100MHz
  • 32 canali per scheda

Handler Pick & Place per circuiti integrati

Gestoreacontrollotermicoattivoagammacompleta Model3110-FT
  • CE Mark
Gestore a controllo termico attivo a gamma completa
Model 3110-FT
  • Prova di temperatura -40~125℃
  • Test finale o test di livello del sistema
  • Imballaggio 3x3 mm~45x45 mm
HandlerditestSingleSitedatavolo  Model3111
  • CE Mark
Handler di test Single Site da tavolo 
Model 3111
  • La macchina è progettata per adattarsi al tavolo
  • Vassoi JEDEC (2)
  • Pacchetti IC: Da 5x5mm a 45x45mm
  • Binning configurabile sul software
Tri-TempOctalSitesHandler 3160-C
  • CE Mark
  • Taiwan Excellence 2018
Tri-Temp Octal Sites Handler
3160-C
  • Tecnologia termica avanzata (Nitro TEC)
  • Tempo di indicizzazione più rapido 0,6 sec
  • Controllo termico attivo e intervallo di temperature completo
  • Design privo di camera
  • Supporta più ambienti (siti di prova singolo, doppio, quadruplo)
Gestorediprovainsitoottale Model3180
  • CE Mark
Gestore di prova in sito ottale
Model 3180
  • Fino a x8 siti di test paralleli
  • Fino a 9000 UPH
  • Prova di temperatura da ambiente~ 150 ℃
HybridSingleSiteTestHandler Model3110
Hybrid Single Site Test Handler
Model 3110
  • Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) 
  • FT+SLT Handler (Two In One)
  • Perfect for Device Engineering Characterization Gathering and Analysis
  • Auto Tray Load/unload & Device Sorting capability
  • Tester Zero waiting time