The Chroma 58604-HD is specifically designed for laser diode burn-in and life testing, featuring high-density, multi-functional, and independently controlled modules. Each module supports up to 384 SMU channels, with individual channels configurable via software to set different current values and measure voltage. The system can accommodate up to 7 modules for a total of 2,688 independent channels.

In auto current control (ACC) mode, the control circuit supplies a highly stable spike free current to each laser diode. Even with fluctuations in device resistance and temperature, the supplied current remains fixed at the pre-set value throughout the burn-in test, while voltage values are measured and recorded as quality reference parameters.

With feedback signal from the optional external Photo Diode, the control circuit can adjust the forced current automatically to keep a constant optical power output over the test period. The device voltage and current are recorded as a quality reference parameter.

The patented heat plate ensures precise temperature control of the laser diode substrate with excellent stability and uniformity. Compared to oven or chambertype burn-in systems, Chroma's solution is more streamlined, easier to operate, and more energy-efficient, while delivering superior performance. The 58604-HD also features a smaller footprint, more operational versatility, and more convenient maintenance.

Users can set different burn-in temperatures, current conditions, and operation modes (ACC/APC) for individual modules, as well as start times and burn-in durations. This independent modular control provides greater flexibility, allowing each module to use custom fixtures for different DUTs or packaging types while eliminating electrical and thermal interference.

The system's unique circuit design ensures complete protection of the laser diodes throughout the burn-in process, preventing current or voltage spikes that could damage the DUTs. Each channel allows custom high/low current and voltage limits, triggering an automatic shutdown if thresholds are exceeded. If an anomaly occurs, only the affected channel is disabled, while all other channels continue operating normally until the test is completed. The SMU also includes full channel isolation and electrostatic discharge (ESD) protection.

Burn-in test data is stored on the system's local computer or a designated remote server. If communication between the module and PC is temporarily disrupted, the data will be buffered in the module for 6 hours or more. After communication is restored, the buffered data is automatically and losslessly uploaded to the PC or server.