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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.
Quick Menu
Système de test SoC
SoC/Analog Test System
Model 3650-S2
- 12 emplacements universels pour les applications numériques, analogiques et à signaux mixtes
- Jusqu'à 768 E/S numériques et broches analogiques
- Fréquence d'horloge de 50 / 100 MHz
- Débit de données de 100 / 200 Mbps (MUX)
Advanced SoC Test System
Model 3680
- 24 interchangeable slots for digital, analog and mixed-signal applications
- Data rate up to 1Gbps
- Up to 2048 sites parallel test
- Up to 2048 digital I/O pins
Advanced SoC/Analog Test System
Model 3650
- Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
- Expandable platform with up to 640 channels
- 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
- Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
Advanced SoC/Analog Test System
Model 3650-EX
- Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
- Expandable platform with up to 1024 IO channels and 96 DPS
- 50/100 MHz, 200 MHz (MUX) Test Rate
- Varieties of high density options include VI45, PVI100, HDADDA and MRX
Système de test VLSI
VLSI Test System
Model 3380P
- 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
- Up to 512 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSI Test System
Model 3380D
- 100 MHz clock rate, 256 I/O digital I/O pins
- Up to 256 sites Parallel testing
- Various VI source
- Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSI Test System
Model 3380
- 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
- Up to 1024 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
High Voltage Device Power Supply
Model 33021
- Max. 48V DC output with 2 channels per card
PXIe Programmable Device Power Supply
Model 33020
- High channel density with 8 channels per card
Universal Relay Driver Control
Model 33011
- PXIe based universal relay control
- 32CH direct relay drivers
- 2 lanes of SPI relay control interface
Carte IO numérique haute vitesse PXIe
Model 33010
- Connecteur de bus PXIe standard
- Fréquence d'horloge maximale de 100MHz
- 32 canaux par carte
Automate programmable Pick & Place CI
Single Site Test Handler
Model 3210
- SLT handler
- Ideal for early device design and engineering validation
- Compatible kit to scale-up production
- ATC Tri-temp -40℃ to 150℃ IC test
Gestionnaire d'essai hybride à site unique
Model 3110
- FT and SLT compatible handler
- Compatible kit to scale-up production
- ATC Tri-temp -40 to 150 ℃ IC test (Optional -55 to 150℃ , -70 to 150℃)
- Auto tray loading/unloading and device sorting capability
Poignée à contrôle thermique actif à gamme complète
Model 3110-FT
- Test de température de -40~125℃
- Test final ou test au niveau du système
Automate de tests sur site unique de table
Model 3111
- Test de température de -40~125℃
- Test final ou test au niveau du système
- La machine est conçue pour s'adapter à la table
- Plateaux JEDEC (2)
- Ensembles CI : 5x5mm à 45x45mm
- Regroupement configurable par logiciel
Tri-Temp Octal Sites Handler
3160-C
- Technologie thermique avancée (Nitro TEC)
- Temps d'indexation plus rapide 0,6 s
- Contrôle thermique actif et plage complète de température
- Conception sans chambre
- Prend en charge plusieurs sites (site de test unique, double ou quadruple)
Gestionnaire de test sur site octal
Model 3180
- Jusqu'à x8 sites d'essai parallèles
- Jusqu’à 9000 UPH
- Test de température à partir de la température ambiante ~ 150 ℃
Temperature Forcing System
Model 31000R Series
- -70°C to 150°C temperature range
- Cost competitive
- Compact footprint
- Semi-automation
- Liquid-free Operation
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