The V-by-One signal interface is widely adopted in large-size, high-definition, high-resolution, and high-color-depth displays. Compared to traditional interfaces, it reduces the number of signal lines, which helps lower cost and achieve lighter designs. At the same time, it addresses timing skew issues between transmission lines caused by high-speed data transfer, thereby enabling high-speed and long-distance transmission. The A291802 signal module complies with the V-by-One HS V1.4 standard and supports 4 / 8 / 16 Lane output with a maximum data rate of 3.75Gbps per lane. Up to 64 lanes can be achieved by paralleling four A291802 modules. The module supports 8K UHD (Ultra High Definition) video output, and when paired with the Chroma 2918 mainframe, it enables testing of resolutions up to 8K (8192 × 4320) @120Hz, providing users with a flexible range of test configurations.
The A291802 supports selection between color depths of 6, 8, 10 and 12 bits for testing. For instance, with a 10-bit color depth, each primary color is divided into 1024 levels (210), allowing for approximately 1.07 billion different colors to be displayed (210 R × 210 G × 210 B). This enables you to customize your inspection application as needed.
*For 12-bit color depth applications, use the ICON Pattern Editing function and 5 Bytes Mode (Timing) to ensure proper output and display.
For LCD panel quality testing, the A291802 complies with the V-by-One HS V1.4 standard and provides three selectable packet formats: 3 Bytes, 4 Bytes, and 5 Bytes. Users can configure the A291802 to output the corresponding packet format based on the requirements of the panel under test, enabling fast and accurate verification of whether the display panel can be correctly lit.
To support the wide variety of display data-mapping schemes, the A291802 provides multiple V-by-One modes for lane splitting, arrangement, and combination across 8 / 16 / 32 / 64 lanes, offering the flexibility needed for data-mapping designs of different panel specifications.
For critical signal transmission testing, the A291802 supports 32 levels of Pre-Emphasis adjustment (0 / 0.22 / 0.45 / 0.68 / 0.92 / 1.16 / 1.41 / 1.67 / 1.94 / 2.21 / 2.50 / 2.79 / 3.10 / 3.41 / 3.74 / 4.08 / 4.44 / 4.81 / 5.19 / 5.60 / 6.02 / 6.47 / 6.94 / 7.43 / 7.96 / 8.52 / 9.12 / 9.76 / 10.46 / 11.21 / 12.04 / 12.96 dB), allowing the output to be intentionally offset from the standard signal. This capability enables comprehensive margin testing for evaluating the performance limits of the device under test (DUT).
The A291802 supports 16 different Swing Levels (253 / 316 / 377 / 439 / 499 / 561 / 621 / 682 / 743 / 799 / 857 / 909 / 959 / 1002 / 1043 / 1074 mV), enabling critical signal transmission testing. By intentionally shifting the output away from standard signal levels, it allows for margin testing to evaluate the performance limits of the DUT.
SSC (Spread Spectrum Clocking) is a technique used to reduce electromagnetic interference (EMI) generated by the device itself. By modulating or spreading the clock signal over a range of frequencies, SSC reduces peak radiated power and minimizes interference between devices caused by concentrated frequency emissions or clock edge effects. The A291802 includes a built-in Center Spread SSC setting mode, allowing users to enable or disable SSC with a modulation frequency of 30,000Hz and a deviation range of 0.5%.
The A291802 is equipped with built-in temperature sensing that continuously tracks changes in the module’s internal temperature and reports them to the control unit. As the temperature rises, the fan automatically increases its speed; as it cools, the fan slows down. This smart adjustment optimizes airflow to reduce operating noise while maintaining ideal thermal performance, extending overall system longevity.
Power, signal, and control pins can be activated independently, with user-defined timing adjustable in 1ms increments. Users can freely configure lead/lag timing for power, signal, and control outputs, including customized shutdown sequences.
ESD (Electrostatic Discharge) damage to electronic products has been an ongoing challenge to address. During regular use, ESD may cause instability and sudden functional anomalies. To avoid damage caused by ESD during IC production, A291800 features IEC/EN 61000-4-2 compliant ESD protection capability (15kV Air / 8kV Contact Discharge) and includes built-in ESD protection circuits, providing complete protection against ESD impact.
Supporting the latest variable refresh-rate technology, the A291802 leverages its high-speed refresh rate capability to verify whether the DUT functions properly under continuous image refresh conditions. It is equipped with four test modes: Saw, Ramp, Square, and Arbitrary. The standard modes (Saw / Ramp / Square) allow 1 to 50 steps with a time interval from 1 to 600 seconds, allowing flexible adjustment of the refresh rate. In Arbitrary Mode, up to 5 different periods can be set and switched dynamically, covering a comprehensive range of panel refresh rate testing requirements. (Optional)
▲ SAW
▲ Ramp
▲ Square
▲ Arbitrary
Licensed by The Institute of Image Information and Television Engineers, a wide range of 8K Ultra-High Resolution color gamut test patterns are available. (Optional)
Applications: panel manufacturers, driver IC design, repair centers, PCB substrate testing, automated test equipment manufacturers, IC reliability testing, demonstration, product verification, etc.
Panel Manufacturer
Driver IC Design
Repair Center
PCB Substrate Testing
Automatic Testing
Equipment Manufacturer
IC Reliability Testing
Demonstration
Product Verification
