VLSI Test System Model 3380P

Caractéristiques principales
  • 50/100 MHz clock rate
  • 50/100 Mbps data rate
  • 1024 I/O pins (max. 1280 I/O pins)
  • Up to 1024 sites parallel testing
  • 32/64/128 pattern memory
  • 16M capture memory per pin
  • Various VI source
  • Flexible hardware architecture (interchangeable I/O, VI, ADDA,)
  • Real parallel trim/match function
  • Time and frequency measurement unit (TFMU)
  • STDF tools support
  • Test program/pattern converter (J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.)
  • AD/DA test (option)
  • SCAN test option (max. 2G M/chain)
  • ALPG test option for embedded memory
  • CRAFT C/C++ programming language
  • Software interface same as 3380P/3360P
  • User-friendly Windows 7 environment

In order to cope with the IC testing trend of high-speed, numerous pins and complex functions in the future, the newest generation of Chroma's VLSI test systems, 3380D/3380P/3380, have adopted a more flexible architecture with higher integration density and powerful functions.

The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.

The test system 3380P also has built in all-in-one design (for test head only) to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.

 Rich Functions and Wide Coverage

Logic, MCU, ADDA (Mixed-signal) ; Power, LED driver, Class D ; SCAN, ALPG, Match and etc.

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Référence de modèle

VLSI Test System