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IC Pick & Place Handler
Full Range Active Thermal Control Handler
Model 3110-FT
- Temperature Test from -40~125℃
- Final Test or System Level Test
- 3x3mm~45x45mm Package
Tabletop Single Site Test Handler
Model 3111
- Tabletop design for smaller table space 60 cm2
- (2) Fixed JEDEC trays
- IC package size ranges: 5x5mm to 45x45mm
- Software configurable binning
Tri-Temp Octal Sites Handler
3160-C
- Advance thermal technology (Nitro TEC)
- Faster index time 0.6 sec
- Active thermal control and full range temperature
- Chamber less design
Octal Site Test Handler
Model 3180
- Up to x8 parallel test sites
- Up to 9000 UPH
- Temperature test from ambient ~150℃
Hybrid Single Site Test Handler
Model 3110
- Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃)
- FT+SLT Handler (Two In One)
- Perfect for Device Engineering Characterization Gathering and Analysis
- Auto Tray Load/unload & Device Sorting capability
- Tester Zero waiting time
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