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Gallery View List View Full Range Active Thermal Control HandlerModel 3110-FT Temperature Test from -40~125℃ Final Test or System Level Test 3x3mm~45x45mm Package Add to Inquiry Cart Tabletop Single Site Test HandlerModel 3111 Tabletop design for smaller table space 60 cm2 (2) Fixed JEDEC trays IC package size ranges: 5x5mm to 45x45mm Software configurable binning Add to Inquiry Cart Tri-Temp Octal Sites Handler3160-C Advance thermal technology (Nitro TEC) Faster index time 0.6 sec Active thermal control and full range temperature Chamber less design Add to Inquiry Cart Octal Site Test HandlerModel 3180 Up to x8 parallel test sites Up to 9000 UPH Temperature test from ambient ~150℃ Add to Inquiry Cart Hybrid Single Site Test HandlerModel 3110 Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) FT+SLT Handler (Two In One) Perfect for Device Engineering Characterization Gathering and Analysis Auto Tray Load/unload & Device Sorting capability Tester Zero waiting time Add to Inquiry Cart
Gallery View List View Full Range Active Thermal Control HandlerModel 3110-FT Temperature Test from -40~125℃ Final Test or System Level Test 3x3mm~45x45mm Package Add to Inquiry Cart Tabletop Single Site Test HandlerModel 3111 Tabletop design for smaller table space 60 cm2 (2) Fixed JEDEC trays IC package size ranges: 5x5mm to 45x45mm Software configurable binning Add to Inquiry Cart Tri-Temp Octal Sites Handler3160-C Advance thermal technology (Nitro TEC) Faster index time 0.6 sec Active thermal control and full range temperature Chamber less design Add to Inquiry Cart Octal Site Test HandlerModel 3180 Up to x8 parallel test sites Up to 9000 UPH Temperature test from ambient ~150℃ Add to Inquiry Cart Hybrid Single Site Test HandlerModel 3110 Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) FT+SLT Handler (Two In One) Perfect for Device Engineering Characterization Gathering and Analysis Auto Tray Load/unload & Device Sorting capability Tester Zero waiting time Add to Inquiry Cart