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SoC Test System

AdvancedSoC/AnalogTestSystem Model3680
  • Taiwan Excellence 2022
Advanced SoC/Analog Test System
Model 3680
  • 24 interchangeable slots for digital, analog and mixed-signal applications
  • 150 Mbps up to 1Gbps data rate (muxed)
  • Up to 512 sites parallel test
  • Up to 2048 digital I/O pins
AdvancedSoC/AnalogTestSystem Model3650
Advanced SoC/Analog Test System
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
AdvancedSoC/AnalogTestSystem Model3650-EX
Advanced SoC/Analog Test System
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX

VLSI Test System

VLSITestSystem Model3380P
VLSI Test System
Model 3380P
  • 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
  • Up to 512 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSITestSystem Model3380D
VLSI Test System
Model 3380D
  • 100 MHz clock rate, 256 I/O digital I/O pins
  • Up to 256 sites Parallel testing
  • Various VI source
  • Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSITestSystem Model3380
VLSI Test System
Model 3380
  • 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
  • Up to 1024 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
UniversalRelayDriverControl Model33011
  • PXI Systems Alliance
Universal Relay Driver Control
Model 33011
  • PXIe based universal relay control
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
HighSpeedPXIeDigitalIOCard Model33010
  • PXI Systems Alliance
High Speed PXIe Digital IO Card
Model 33010
  • Standard PXIe bus connector
  • 100MHz maximum clock rate
  • 32 channels per board

IC Pick & Place Handler

HybridSingleSiteTestHandler Model3110
Hybrid Single Site Test Handler
Model 3110
  • Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) 
  • FT+SLT Handler (Two In One)
  • Perfect for Device Engineering Characterization Gathering and Analysis
  • Auto Tray Load/unload & Device Sorting capability
  • Tester Zero waiting time
FullRangeActiveThermalControlHandler Model3110-FT
  • CE Mark
Full Range Active Thermal Control Handler
Model 3110-FT
  • Temperature Test from -40~125℃
  • Final Test or System Level Test
  • 3x3mm~45x45mm Package
TabletopSingleSiteTestHandler Model3111
  • CE Mark
Tabletop Single Site Test Handler
Model 3111
  • Tabletop design for smaller table space 60 cm2
  • (2) Fixed JEDEC trays
  • IC package size ranges: 5x5mm to 45x45mm
  • Software configurable binning
Tri-TempOctalSitesHandler 3160-C
  • CE Mark
  • Taiwan Excellence 2018
Tri-Temp Octal Sites Handler
3160-C
  • Advance thermal technology (Nitro TEC)
  • Faster index time 0.6 sec
  • Active thermal control and full range temperature
  • Chamber less design
OctalSiteTestHandler Model3180
  • CE Mark
Octal Site Test Handler
Model 3180
  • Up to x8 parallel test sites
  • Up to 9000 UPH
  • Temperature test from ambient ~150℃