Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.

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SoC Test System

SoC/AnalogTestSystem Model3650-S2
SoC/Analog Test System
Model 3650-S2
  • 12 Universal slots for digital, analog and mixed-signal applications
  • Up to 768 digital I/O and analog pins
  • 50 / 100 MHz clock rate
  • 100 / 200 Mbps (MUX) data rate
AdvancedSoCTestSystem Model3680
  • Taiwan Excellence 2022
Advanced SoC Test System
Model 3680
  • 24 interchangeable slots for digital, analog and mixed-signal applications
  • Data rate up to 1Gbps
  • Up to 2048 sites parallel test
  • Up to 2048 digital I/O pins
AdvancedSoC/AnalogTestSystem Model3650
Advanced SoC/Analog Test System
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
AdvancedSoC/AnalogTestSystem Model3650-EX
Advanced SoC/Analog Test System
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX

VLSI Test System

VLSITestSystem Model3380P
VLSI Test System
Model 3380P
  • 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
  • Up to 512 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSITestSystem Model3380D
VLSI Test System
Model 3380D
  • 100 MHz clock rate, 256 I/O digital I/O pins
  • Up to 256 sites Parallel testing
  • Various VI source
  • Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSITestSystem Model3380
VLSI Test System
Model 3380
  • 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
  • Up to 1024 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
UniversalRelayDriverControl Model33011
  • PXI Systems Alliance
Universal Relay Driver Control
Model 33011
  • PXIe based universal relay control
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
HighSpeedPXIeDigitalIOCard Model33010
  • PXI Systems Alliance
High Speed PXIe Digital IO Card
Model 33010
  • Standard PXIe bus connector
  • 100MHz maximum clock rate
  • 32 channels per board

IC Pick & Place Handler

SingleSiteTestHandler Model3210
Single Site Test Handler
Model 3210
  • SLT handler 
  • Ideal for early device design and engineering validation
  • Compatible kit to scale-up production
  • ATC Tri-temp -40℃ to 150℃ IC test
HybridSingleSiteTestHandler Model3110
Hybrid Single Site Test Handler
Model 3110
  • FT and SLT compatible handler 
  • Compatible kit to scale-up production
  • ATC Tri-temp -40 to 150 ℃ IC test (Optional -55 to 150℃ , -70 to 150℃)
  • Auto tray loading/unloading and device sorting capability
FullRangeActiveThermalControlHandler Model3110-FT
  • CE Mark
Full Range Active Thermal Control Handler
Model 3110-FT
  • Temperature Test from -40~125℃
  • Final Test or System Level Test
  • 3x3mm~45x45mm Package
TabletopSingleSiteTestHandler Model3111
  • CE Mark
Tabletop Single Site Test Handler
Model 3111
  • Tabletop design for smaller table space 60 cm2
  • (2) Fixed JEDEC trays
  • IC package size ranges: 5x5mm to 45x45mm
  • Software configurable binning
Tri-TempOctalSitesHandler 3160-C
  • CE Mark
  • Taiwan Excellence 2018
Tri-Temp Octal Sites Handler
3160-C
  • Advance thermal technology (Nitro TEC)
  • Faster index time 0.6 sec
  • Active thermal control and full range temperature
  • Chamber less design
OctalSiteTestHandler Model3180
  • CE Mark
Octal Site Test Handler
Model 3180
  • Up to x8 parallel test sites
  • Up to 9000 UPH
  • Temperature test from ambient ~150℃
TemperatureForcingSystem Model31000RSeries
Temperature Forcing System
Model 31000R Series
  • -70°C to 150°C temperature range
  • Cost competitive
  • Compact footprint
  • Semi-automation
  • Liquid-free Operation