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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.

SoC 테스트 시스템

SoC/AnalogTestSystem Model3650-S2
SoC/Analog Test System
Model 3650-S2
  • 디지털, 아날로그 및 혼합 신호 애플리케이션을 위한 12개의 범용 슬롯
  • 최대 768개의 디지털 I/O 및 아날로그 핀
  • 50 / 100MHz의 클럭 속도
  • 100 / 200Mbps(MUX) 데이터 속도
Wireless&RFFunctionBoard HDRF2
Wireless & RF Function Board
  • VST*4 ; RF port*32
  • Direct mount
  • 8/16 sites test
  • Wi-Fi、BT、Sub 6GHz、IOT、GPS、LoRa、NB-IoT
고급SoC테스트시스템 Model3680
  • Taiwan Excellence 2022
고급 SoC 테스트 시스템
Model 3680
  • 디지털, 아날로그 및 혼합 신호 응용 분야를 위한 24개 교체 가능 슬롯
  • 최대 1Gbps의 데이터 속도
  • 최대 2048개 사이트 병렬 테스트
  • 최대 2048 디지털 I/O 핀
SoC/아날로그테스트시스템 Model3650
SoC/아날로그 테스트 시스템
Model 3650
  • 응용 분야 지원 범위: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • 최대 640채널로 확장 가능한 플랫폼
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • 다양한 고밀도 옵션, 아날로그, ADDA, 혼합 신호부터 TIA까지 지원
AdvancedSoC/AnalogTestSystem Model3650-EX
Advanced SoC/Analog Test System
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX