SoC 테스트 시스템

Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using “system in a package” and “heterogeneous integrated package” methods to run at higher speed with more connection pins. Chroma’s semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe’s size and flexibility to drive all your semiconductor innovations.