Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.

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Ladezustands (SoC) Testsystem

SoC/AnalogTestSystem Model3650-S2
SoC/Analog Test System
Model 3650-S2
  • 12 universelle Steckplätze für Digital-, Analog- und Gemischtsignal-Anwendungen
  • Bis zu 768 digitale I/O- und analoge Pins
  • Taktrate von 50 / 100 MHz
  • Datenrate von 100 / 200 Mb/s (MUX)
HochentwickeltesSoCTestsystem Model3680
  • Taiwan Excellence 2022
Hochentwickeltes SoC Testsystem
Model 3680
  • 24 austauschbare Steckplätze für digitale, analoge und Mixed-Signal-Systeme
  • Datenrate bis zu 1 Gbit/s
  • Bis zu 2048 Standorte parallel testen
  • Bis zu 2048 digitale E/A-Pins
AdvancedSoC/AnalogTestSystem Model3650
Advanced SoC/Analog Test System
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
AdvancedSoC/AnalogTestSystem Model3650-EX
Advanced SoC/Analog Test System
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX

VLSI Testsystem

VLSITestSystem Model3380P
VLSI Test System
Model 3380P
  • 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
  • Up to 512 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSITestSystem Model3380D
VLSI Test System
Model 3380D
  • 100 MHz clock rate, 256 I/O digital I/O pins
  • Up to 256 sites Parallel testing
  • Various VI source
  • Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSITestSystem Model3380
VLSI Test System
Model 3380
  • 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
  • Up to 1024 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
UniversalRelayDriverControl Model33011
  • PXI Systems Alliance
Universal Relay Driver Control
Model 33011
  • PXIe based universal relay control
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
Hochgeschwindigkeits-PXIeDigital-IO-Karte Model33010
  • PXI Systems Alliance
Hochgeschwindigkeits-PXIe Digital-IO-Karte
Model 33010
  • Standard PXIe-Busanschluss
  • 100 MHz maximale Taktfrequenz
  • 32 Kanäle pro Karte

IC Bestückungshandler

SingleSiteTestHandler Model3210
Single Site Test Handler
Model 3210
  • SLT handler 
  • Ideal for early device design and engineering validation
  • Compatible kit to scale-up production
  • ATC Tri-temp -40℃ to 150℃ IC test
Hybrid-Einzelprüfstation Model3110
Model 3110
  • FT and SLT compatible handler 
  • Compatible kit to scale-up production
  • ATC Tri-temp -40 to 150 ℃ IC test (Optional -55 to 150℃ , -70 to 150℃)
  • Auto tray loading/unloading and device sorting capability
AktivesVollbereichs-Thermokontrollgerät Model3110-FT
  • CE Mark
Aktives Vollbereichs- Thermokontrollgerät
Model 3110-FT
  • Temperaturtest von -40 ~ 125 ˚C
  • Abschlusstest
  • Paket 3x3 mm ~ 45x45x45 mm
Einzel-Site-TesthandlerimTischformat Model3111
  • CE Mark
Einzel-Site-Testhandler im Tischformat
Model 3111
  • Die Maschine ist so konzipiert, dass sie auf den Tisch passt
  • JEDEC-Träger (2)
  • IC-Einheiten: 5x5mm bis 45x45mm
  • Konfigurierbare Einlagerung über Software
Tri-TempOctalSitesHandler 3160-C
  • CE Mark
  • Taiwan Excellence 2018
Tri-Temp Octal Sites Handler
  • Erweiterte Wärmetechnik (Nitro-TEC)
  • Schnellere Indexzeit von 0,6 s
  • Aktive Wärmesteuerung und kompletter Temperaturbereich
  • Kammerloses Design
  • Unterstützt mehrere Sites (Single-, Dual- oder Quad-Teststelle(n))
Achtfach-Prüfstation Model3180
  • CE Mark
Model 3180
  • Bis zu 8 parallele Prüfvorrichtungen
  • Bis 9000 Stück pro Stunde
  • Temperaturtest bei einer Umgebung bis 150 °C
TemperatureForcingSystem Model31000RSeries
Temperature Forcing System
Model 31000R Series
  • -70°C to 150°C temperature range
  • Cost competitive
  • Compact footprint
  • Semi-automation
  • Liquid-free Operation