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Ladezustands (SoC) Testsystem

HochentwickeltesSoC/AnalogTestsystem Model3680
  • Taiwan Excellence 2022
Hochentwickeltes SoC/Analog Testsystem
Model 3680
  • 24 austauschbare Steckplätze für digitale, analoge und Mixed-Signal-Systeme
  • 150 Mbps bis zu 1Gbps Datenrate (gemischt)
  • Bis zu 512 Sites parallel testen
  • Bis zu 2048 digitale E/A-Pins
AdvancedSoC/AnalogTestSystem Model3650
Advanced SoC/Analog Test System
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
AdvancedSoC/AnalogTestSystem Model3650-EX
Advanced SoC/Analog Test System
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX