Designed for advanced semiconductor packaging, the Chroma 7980 delivers high-precision critical dimension (CD) measurement with sub-nanometer resolution to capture the finest structural details. Its robust system architecture and intelligent algorithms boost inspection efficiency, enable more accurate process judgments, and raise overall yield.

The Taiwan Excellence Awards announced the winners of its 2026 program on November 26. Competition was intense, with well over 1,000 entries submitted and only 336 products receiving Taiwan Excellence recognition. The prestigious Gold Award was awarded to only 10 products.

Chroma ATE was honored to earn this distinction with its 7980 2D/3D Wafer Metrology System. The system excelled through a four-month, multi-round evaluation by a cross-disciplinary team of experts. Assessed across four core criteria—design, innovation, quality, and marketing—the judges recognized the 7980's breakthrough innovation and strong global market potential. Known for its thorough assessment process, the Taiwan Excellence Gold Award has become a trusted indicator for industry-leading technology and exceptional market impact.

Purpose-built for advanced packaging challenges: Sub-nanometer resolution elevates yield across the process

As advanced packaging has opened a new chapter in Moore's Law, technologies such as CoWoS and InFO demand exceptionally precise, nano-scale critical dimension metrology. The Chroma 7980 was created specifically to meet these challenges.

Equipped with Chroma's patented BLiS™ technology, the system is engineered for precision at the nano scale. Its application-optimized algorithms and interface enable high-speed measurement, rapid-focus surface profiling, and large-area image stitching. These capabilities support precise measurement of complex advanced-packaging structures such as TSV/VIA, RDL, probe marks, overlay, and sub-micron surface profiles—delivering breakthrough yield improvements for semiconductor manufacturers worldwide.

▲ T.Y. Cheng (right), Vice President of Chroma's Optical Inspection Business Unit,
receives the Taiwan Excellence Gold Award from Minister of Economic Affairs Kung Ming-hsin

“Advancing Excellence”as our commitment to customers

This Gold Award represents the highest recognition of Chroma's in-house innovation and engineering strength. Guided by our vision“Empowering future technologies for a better world”and our mission to “Enable quality innovation at every step with reliable solutions,”we will continue advancing excellence through deep R&D investment and industry-leading metrology solutions. 
Chroma is fully committed to supporting the semiconductor and high-tech sectors in their ongoing pursuit of quality and yield improvement—and to remaining a trusted partner to customers around the world.