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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.


SoC/AnalogTestSystem Model3650-S2
SoC/Analog Test System
Model 3650-S2
  • 12 Universal slots for digital, analog and mixed-signal applications
  • Up to 768 digital I/O and analog pins
  • 50 / 100 MHz clock rate
  • 100 / 200 Mbps (MUX) data rate
Wireless&RFFunctionBoard HDRF2
Wireless & RF Function Board
  • VST*4 ; RF port*32
  • Direct mount
  • 8/16 sites test
  • Wi-Fi、BT、Sub 6GHz、IOT、GPS、LoRa、NB-IoT
高機能SOCテストシステム Model3680
  • Taiwan Excellence 2022
Model 3680
  • デジタル測定及びアナログ測定基板を24枚実装可能(組合せ自由)
  • 最大1Gbpsのデータレート
  • 最大2048 サイトの並列テスト
  • 最大2048デジタルI/Oピン
SoC/AnalogTestSystem Model3650
SoC/Analog Test System
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
SoC/アナログテストシステム Model3650-EX
Model 3650-EX
  • ロジック/アナログ測定機能を自由に組み合わせ
  • 各種デバイスに対応できる最適な半導体テストシステム