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SoC試験システム

AdvancedSoC/AnalogTestSystem
Advanced SoC/Analog Test System
Model 3680
  • 24 interchangeable slots for digital, analog and mixed-signal applications
  • 150 Mbps up to 1Gbps data rate (muxed)
  • Up to 512 sites parallel test
  • Up to 2048 digital I/O pins
AdvancedSoC/AnalogTestSystem
Advanced SoC/Analog Test System
Model 3650
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer 
  • Expandable platform with up to 640 channels
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
SoC/アナログテストシステム
SoC/アナログテストシステム
Model 3650-EX
  • ロジック/アナログ測定機能を自由に組み合わせ
  • 各種デバイスに対応できる最適な半導体テストシステム
AdvancedSoC/AnalogTestSystem
Advanced SoC/Analog Test System
Model 3650-CX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 256 channels
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA

VLSI試験システム

VLSITestSystem
VLSI Test System
Model 3380P
  • 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
  • Up to 512 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSITestSystem
VLSI Test System
Model 3380D
  • 100 MHz clock rate, 256 I/O digital I/O pins
  • Up to 256 sites Parallel testing
  • Various VI source
  • Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSITestSystem
VLSI Test System
Model 3380
  • 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
  • Up to 1024 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
PXIeユニバーサルリレードライバコントローラモジュール
  • PXI Systems Alliance
PXIe ユニバーサルリレードライバコントローラモジュール
Model 33011
  • PXIeベースのユニバーサルリレーコントローラ
  • 32チャンネルダイレクトリレードライバ
  • 2レーンSPIリレーコントロールインターフェース
PXIeプログラマブル高速デジタルIOカード
  • PXI Systems Alliance
PXIe プログラマブル高速デジタルIOカード
Model 33010
  • PXIeバス接続
  • 最大周波数:100MHz
  • チャンネル数:32(最大256chまで拡張可能)
  • 3380D/3380P/3380と互換性のあるプログラム

ピックアップ&プレースハンドラ

低高温(ATC)ICテストハンドラ
  • CE Mark
低高温(ATC)ICテストハンドラ
Model 3110-FT
  • 設定可能温度 -40~125℃
  • FT試験及びSLT試験対応
  • 測定可能パッケージ寸法 3x3 mm~45x45 mm
  • コンタクト圧制御可能範囲 1~10 kg (オプション)
TabletopSingleSiteTestHandler
  • CE Mark
Tabletop Single Site Test Handler
Model 3111
  • Tabletop design for smaller table space 60 cm2
  • (2) Fixed JEDEC trays
  • IC package size ranges: 5x5mm to 45x45mm
  • Software configurable binning
RFSolutionIntegratedHandler 
RF Solution Integrated Handler 
Model 3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
Tri-TempOctalSitesHandler
  • CE Mark
  • Taiwan Excellence
Tri-Temp Octal Sites Handler
3160-C
  • Advance thermal technology (Nitro TEC)
  • Faster index time 0.6 sec
  • Active thermal control and full range temperature
  • Chamber less design
OctalSiteTestHandler
  • CE Mark
Octal Site Test Handler
Model 3180
  • Up to x8 parallel test sites
  • Up to 9000 UPH
  • Temperature test from ambient ~150℃
HybridSingleSiteTestHandler
Hybrid Single Site Test Handler
Model 3110
  • Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) 
  • FT+SLT Handler (Two In One)
  • Perfect for Device Engineering Characterization Gathering and Analysis
  • Auto Tray Load/unload & Device Sorting capability
  • Tester Zero waiting time
DieTestHandler
Die Test Handler
Model 3112
  • Reliable Pick&Place bare die test handler
  • Multi-plate input and automated test sorting capability
  • Omni-directional adjustable probe stage (X/Y/Z/θ)
  • Stage remain die check function
AutomaticSystemFunctionTester
Automatic System Function Tester
Model 3240
  • Innovative handler for high volume/multi-site IC testing at system level.
  • Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.
AutomaticSystemFunctionTester
Automatic System Function Tester
Model 3260
  • Innovative handler for high volume/multi-site IC testing at system level.
  • Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.
MiniatureICHandler 
Miniature IC Handler 
Model 3270
Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level.
CobraTemperatureForcingSystemforATE/SLTTestApplications
Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R
  • Temperature range of -40°C to 150°C
  • Compact footprint
  • Self-contained – No external chiller required
  • Liquid-free Operation