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海外拠点
Tel: +81-45-542-1118
Email Chroma: info@chroma.co.jp
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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using “system in a package” and “heterogeneous integrated package” methods to run at higher speed with more connection pins. Chroma’s semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe’s size and flexibility to drive all your semiconductor innovations.
Quick Menu
SoC試験システム
高機能SOC/ANALOGテストシステム
Model 3680
- デジタル測定及びアナログ測定基板を24枚実装可能(組合せ自由)
- 最大データレート150 Mbps
- 最大512パラレルテスト対応
- 最大2048デジタルI/Oピン
Advanced SoC/Analog Test System
Model 3650
- Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
- Expandable platform with up to 640 channels
- 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
- Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
VLSI試験システム
VLSI Test System
Model 3380P
- 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
- Up to 512 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSI Test System
Model 3380D
- 100 MHz clock rate, 256 I/O digital I/O pins
- Up to 256 sites Parallel testing
- Various VI source
- Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSI Test System
Model 3380
- 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
- Up to 1024 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
PXIe ユニバーサルリレードライバコントローラモジュール
Model 33011
- PXIeベースのユニバーサルリレーコントローラ
- 32チャンネルダイレクトリレードライバ
- 2レーンSPIリレーコントロールインターフェース
PXIe プログラマブル高速デジタルIOカード
Model 33010
- PXIeバス接続
- 最大周波数：100MHz
- チャンネル数：32（最大256chまで拡張可能）
- 3380D/3380P/3380と互換性のあるプログラム
ピックアップ＆プレースハンドラ
Hybrid Single Site Test Handler
Model 3110
- Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃)
- FT+SLT Handler (Two In One)
- Perfect for Device Engineering Characterization Gathering and Analysis
- Auto Tray Load/unload & Device Sorting capability
- Tester Zero waiting time
低高温(ATC)ICテストハンドラ
Model 3110-FT
- 設定可能温度 -40~125℃
- FT試験及びSLT試験対応
- 測定可能パッケージ寸法 3x3 mm~45x45 mm
- コンタクト圧制御可能範囲 1~10 kg (オプション)
Tabletop Single Site Test Handler
Model 3111
- Tabletop design for smaller table space 60 cm2
- (2) Fixed JEDEC trays
- IC package size ranges: 5x5mm to 45x45mm
- Software configurable binning
RF Solution Integrated Handler
Model 3240-Q
Die Test Handler
Model 3112
- Reliable Pick&Place bare die test handler
- Multi-plate input and automated test sorting capability
- Omni-directional adjustable probe stage (X/Y/Z/θ)
- Stage remain die check function
Tri-Temp Octal Sites Handler
3160-C
- Advance thermal technology (Nitro TEC)
- Faster index time 0.6 sec
- Active thermal control and full range temperature
- Chamber less design
Octal Site Test Handler
Model 3180
- Up to x8 parallel test sites
- Up to 9000 UPH
- Temperature test from ambient ~150℃
Automatic System Function Tester
Model 3240
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.
Automatic System Function Tester
Model 3260
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.
Miniature IC Handler
Model 3270
Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R
- Temperature range of -40°C to 150°C
- Compact footprint
- Self-contained – No external chiller required
- Liquid-free Operation
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