Quick Menu
SoC試験システム
Advanced SoC/Analog Test System
Model 3680
- 24 interchangeable slots for digital, analog and mixed-signal applications
- 150 Mbps up to 1Gbps data rate (muxed)
- Up to 512 sites parallel test
- Up to 2048 digital I/O pins
Advanced SoC/Analog Test System
Model 3650
- Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
- Expandable platform with up to 640 channels
- 50/100 MHz, 200 MHz (MUX) Test Rate
- Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
Advanced SoC/Analog Test System
Model 3650-CX
- Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
- Expandable platform with up to 256 channels
- 50/100 MHz, 200 MHz (MUX) Test Rate
- Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
VLSI試験システム
VLSI Test System
Model 3380P
- 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
- Up to 512 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSI Test System
Model 3380D
- 100 MHz clock rate, 256 I/O digital I/O pins
- Up to 256 sites Parallel testing
- Various VI source
- Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSI Test System
Model 3380
- 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
- Up to 1024 sites Parallel testing
- Various VI source
- Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
PXIe ユニバーサルリレードライバコントローラモジュール
Model 33011
- PXIeベースのユニバーサルリレーコントローラ
- 32チャンネルダイレクトリレードライバ
- 2レーンSPIリレーコントロールインターフェース
PXIe プログラマブル高速デジタルIOカード
Model 33010
- PXIeバス接続
- 最大周波数：100MHz
- チャンネル数：32（最大256chまで拡張可能）
- 3380D/3380P/3380と互換性のあるプログラム
ピックアップ＆プレースハンドラ
低高温(ATC)ICテストハンドラ
Model 3110-FT
- 設定可能温度 -40~125℃
- FT試験及びSLT試験対応
- 測定可能パッケージ寸法 3x3 mm~45x45 mm
- コンタクト圧制御可能範囲 1~10 kg (オプション)
Tabletop Single Site Test Handler
Model 3111
- Tabletop design for smaller table space 60 cm2
- (2) Fixed JEDEC trays
- IC package size ranges: 5x5mm to 45x45mm
- Software configurable binning
RF Solution Integrated Handler
Model 3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
Tri-Temp Octal Sites Handler
3160-C
- Advance thermal technology (Nitro TEC)
- Faster index time 0.6 sec
- Active thermal control and full range temperature
- Chamber less design
Octal Site Test Handler
Model 3180
- Up to x8 parallel test sites
- Up to 9000 UPH
- Temperature test from ambient ~150℃
Hybrid Single Site Test Handler
Model 3110
- Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃)
- FT+SLT Handler (Two In One)
- Perfect for Device Engineering Characterization Gathering and Analysis
- Auto Tray Load/unload & Device Sorting capability
- Tester Zero waiting time
Die Test Handler
Model 3112
- Reliable Pick&Place bare die test handler
- Multi-plate input and automated test sorting capability
- Omni-directional adjustable probe stage (X/Y/Z/θ)
- Stage remain die check function
Automatic System Function Tester
Model 3240
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.
Automatic System Function Tester
Model 3260
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.
Miniature IC Handler
Model 3270
Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level.
Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R
- Temperature range of -40°C to 150°C
- Compact footprint
- Self-contained – No external chiller required
- Liquid-free Operation
- ↑