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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.

VLSI試験システム

VLSITestSystem Model3380P
VLSI Test System
Model 3380P
  • 100Mhz clock rate, 512 I/O channels (Max to 576 pins)
  • Up to 512 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
VLSITestSystem Model3380D
VLSI Test System
Model 3380D
  • 100 MHz clock rate, 256 I/O digital I/O pins
  • Up to 256 sites Parallel testing
  • Various VI source
  • Flexible HW-architecture (Interchangeable I/O, VI, ADDA)
VLSITestSystem Model3380
VLSI Test System
Model 3380
  • 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)
  • Up to 1024 sites Parallel testing
  • Various VI source
  • Flexible Architectures: Slot interchangeable I/O, ADDA, VI source
PXIeユニバーサルリレードライバコントローラモジュール Model33011
  • PXI Systems Alliance
PXIe ユニバーサルリレードライバコントローラモジュール
Model 33011
  • PXIeベースのユニバーサルリレーコントローラ
  • 32チャンネルダイレクトリレードライバ
  • 2レーンSPIリレーコントロールインターフェース
PXIeプログラマブル高速デジタルIOカード Model33010
  • PXI Systems Alliance
PXIe プログラマブル高速デジタルIOカード
Model 33010
  • PXIeバス接続
  • 最大周波数:100MHz
  • チャンネル数:32(最大256chまで拡張可能)
  • 3380D/3380P/3380と互換性のあるプログラム