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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.


SoC/類比測試系統 Model3650-S2
Model 3650-S2
  • 12個通用插槽,全都可用於數位、類比和混合信號應用
  • 多達768個數位和類比通道
  • 時脈頻率: 50 / 100 MHz
  • 數據速率: 100 / 200 Mbps (MUX)
無線射頻功能單板 HDRF2
  • 4 VST, 32射頻端口
  • 精準穩定Direct Mount連接方式
  • 8/16 Sites測試
  • Wi-Fi、BT、Sub 6GHz、IOT、GPS、LoRa、NB-IoT
先進SoC測試系統 Model3680
  • Taiwan Excellence 2022
Model 3680
  • 24個可互換插槽,用於數字、類比和混合信號應用
  • 最高1Gbps數據速率
  • 最高2048 sites並行測試
  • 多達2048個數字通道管腳
SoC/Analog測試系統 Model3650
SoC/Analog 測試系統
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
SoC/Analog測試系統 Model3650-EX
SoC/Analog 測試系統
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX