As the technology of optoelectronic components is maturing, its applications are broadening as well. Take laser diodes for example, they are no longer limited to communication applications but have expanded into consumer products. Photonics test solutions mainly focus on testing optoelectronic components, such as photodiode, LED, EEL, and VCSEL. They can also apply to configurations from upstream to downstream processes, including wafer, laser bar, bare chip, CoS, and TO-CAN. Chroma's system integration technology uniquely combines automation equipment with precision current sources, temperature controllers, and automated optical measurement instruments to perform an array of electrical, optical power, wavelength, near-field and far-field optics, and other optoelectronic characteristic and aging tests.

Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often integrated into production solutions for wafer probe test, burn-in and device or module characterization then reinforced with inspection, metrology, robotics, Industry 4.0 and more.

Quick Menu


製程中晶圓外觀檢查系統 Model7945
  • CE Mark
Model 7945
  • 雙面檢測(切割後晶圓)
  • 異色缺陷檢測
  • 支援多電腦檢測以縮短處理時間
  • 可共用自動進料機設計
光電元件晶圓點測系統 Model58635Series
Model 58635 Series
  • 依據ISO/IEC標準
  • 最大可測試6吋晶圓
  • 寬廣的測試範圍與高精準溫度控制
晶圓檢測系統 Model7940
Model 7940
  • 可同時檢測正反兩面晶圓
  • 最大可檢測6吋擴膜晶圓(檢測區域達8吋範圍)
  • 可因應不同產業的晶粒更換或新增檢測項目
  • 上片後晶圓自動對位機制


光電元件模組多功能測試系統 Model58625
Model 58625
  • 多合一整合型測試機
  • 可彈性安排多種測試站
  • 具精準之溫度平台控制能力
  • 溫控範圍可達-20~85℃
  • 光學模組可支援大角度之發光角量測
雷射二極體燒機及可靠度測試系統 Model58604
  • CE Mark
Model 58604
  • 可提供信賴性測試與老化測試
  • 支援自動電流控制模式(ACC)與自動功率控制模式(APC)
  • 個別通道 (Channel) 驅動與量測 / 每個通道可供應達500 mA 的電流
  • 達125℃ 的精確溫度控制
  • 個別模組獨立操作
高功率雷射二極體燒機及可靠度測試系統 Model58605
Model 58605
  • 可提供燒機測試、可靠度測試與壽命測試
  • 支援自動電流控制模式 (ACC)與自動功率控制模式 (APC)
  • 獨立通道 (Channel) 驅動與量測
  • 獨家設計無突波SMU
  • 最高可達6000 mA單通道電流驅動
光電二極體燒機及可靠度測試系統 Model58606
Model 58606
  • 提供可靠度測試、壽命測試與老化測試
  • 暗電流量測與崩潰電壓量測
  • 每層模組提供256個四象限SMU通道
  • 每通道最高可達80V
半導體雷射特性檢測系統 Model58620
Model 58620
  • 全自動化檢測邊射型雷射二極體芯片
  • 高精密及高容量載具設計、TEC溫度控制穩定度達0.01℃
  • Auto-alignment設計,AOI 輔助定位
  • 共用載具設計可搭配燒機測試
LaserDiodeReliability,Burn-InandLife-TestSystem Model58602
Laser Diode Reliability, Burn-In and Life-Test System
Model 58602
  • Burn-In, Reliability and Life Testing
  • Up to 4608 Channels
  • Up to 20A per device
TO-CAN/CoC燒機測試系統 Model58603
TO-CAN/CoC 燒機測試系統
Model 58603
  • 可提供燒機測試、信賴性測試與壽命測試
  • 每個系統可提供高達10個模組測試
  • 支援自動電流控制模式(ACC)與自動功率控制模式(APC)