Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using “system in a package” and “heterogeneous integrated package” methods to run at higher speed with more connection pins. Chroma’s semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe’s size and flexibility to drive all your semiconductor innovations.

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SOC/類比測試系統 Model3650-S2
Model 3650-S2
  • 12個通用插槽,全都可用於數位、類比和混合信號應用
  • 多達768個數位和類比通道
  • 時脈頻率: 50 / 100 MHz
  • 數據速率: 100 / 200 Mbps (MUX)
先進SoC/模擬測試系統 Model3680
  • Taiwan Excellence 2022
Model 3680
  • 24個可互換插槽,用於數字、模擬和混合信號應用
  • 150 Mbps數據速率 (muxed模式最高最高1Gbps)
  • 最高512 sites並行測試
  • 多達2048個數字通道管腳
SoC/Analog測試系統 Model3650
SoC/Analog 測試系統
Model 3650
  • Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
  • Expandable platform with up to 640 channels
  • 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
  • Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
SoC/Analog測試系統 Model3650-EX
SoC/Analog 測試系統
Model 3650-EX
  • Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
  • Expandable platform with up to 1024 IO channels and 96 DPS
  • 50/100 MHz, 200 MHz (MUX) Test Rate
  • Varieties of high density options include VI45, PVI100, HDADDA and MRX


VLSI測試系統 Model3380P
VLSI 測試系統
Model 3380P
  • 50/100 MHz測試頻率、50/100 Mbps數據速率
  • 512數字通道管腳 (最高可至 576數字通道管腳)
  • 並行測試可達512 sites同測數
  • 多樣彈性VI電源
VLSI測試系統 Model3380D
VLSI 測試系統
Model 3380D
  • 50/100 MHz測試頻率、50/100 Mbps數據速率
  • 256數字通道管腳
  • 並行測試可達256 sites同測數
  • 多樣彈性VI電源
VLSI測試系統 Model3380
VLSI 測試系統
Model 3380
  • 50/100 MHz測試頻率、50/100 Mbps數據速率
  • 1024 I數字通道管腳 (最高1280 數字通道管腳)
  • 高達1024 sites並行測試
HighVoltageDevicePowerSupply Model33021
  • PXI Systems Alliance
High Voltage Device Power Supply
Model 33021
  • Max. 48V DC output with 2 channels per card
UniversalRelayDriverControl Model33011
  • PXI Systems Alliance
Universal Relay Driver Control
Model 33011
  • PXIe based universal relay control
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
HighSpeedPXIeDigitalIOCard Model33010
  • PXI Systems Alliance
High Speed PXIe Digital IO Card
Model 33010
  • Standard PXIe bus connector
  • 100MHz maximum clock rate
  • 32 channels per board

IC測試分類機 (IC Test Handler)

雙用單站測試分類機 Model3110
Model 3110
運用Pick & Place技術,將待測晶片由進料艙移至測試區,再依測試結果進行分類。不但適用於系統功能檢測,也同時具備終端電性測試的能力。
三溫測試分類機 Model3110-FT
  • CE Mark
Model 3110-FT
  • Temperature Test from -40~125℃
  • Final Test or System Level Test
  • 3x3mm~45x45mm Package
桌上型單站測試分類機 Model3111
  • CE Mark
Model 3111
  • 桌上型設計僅占較小空間
  • 可放置兩個JEDEC料盤
  • 支援5x5mm到45x45mm晶片尺寸
  • 可由軟體介面設定分類數
  • 測試頭內建氣室,可吸收及減緩下壓觸力衝擊
無線射頻分類機 Model3240-Q
Model 3240-Q
晶片測試分類機 Model3112
Model 3112
三溫終端測試分類機 3160-C
  • CE Mark
  • Taiwan Excellence 2018
  • 先進的溫控技術(Nitro-TEC 氮氣溫度控制器)
  • 更快的Index Time(0.6 sec)
  • 主動式溫度控制並且提供更全面的測試溫度區間
  • Chamber Less的設計
  • 支持更多樣化測試Sites的選擇(1/2/4 sites)
八站邏輯測試分類機 Model3180
  • CE Mark
Model 3180
  • 具有八個平行測試站點
  • 9Kpcs產能
  • 溫度測試範圍從常溫到高溫150℃
三溫系統板測試分類機 Model3260C
Model 3260C
  • 高速可靠Pick&Place分類機
  • 同步吸嘴雙取與雙放設計
  • IC殘留檢測功能、通用治具設計
  • Nitro TEC主動式溫控技術導入
  • 更快速的升降溫反應速度
自動化系統功能測試機 Model3240
Model 3240
  • 4-sites
  • 可供多組PCB level平行測試的大量生產機具
自動化系統功能測試機 Model3260
Model 3260
  • 6-sites
  • 可供多組PCB level平行測試的大量生產機具
微型IC測試分類機 Model3270
Model 3270
適合CMOS 影像感應元件 (CMOS Image Sensor, CIS)量產所需
CobraTemperatureForcingSystemforATE/SLTTestApplications Model31000R
Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R
  • Temperature range of -40°C to 150°C
  • Compact footprint
  • Self-contained – No external chiller required
  • Liquid-free Operation