Chroma's New HDRF2 Test Board Solves RF Testing Challenges to Unleash Semiconductor Chip Potential

25 Jun 2024

Chroma ATE introduces the latest RF testing board, the HDRF2, specifically designed for RF testing of semiconductor chips. As an optional module for the Chroma 3680 Advanced SoC Test System, the HDRF2 meets the needs of various fields such as IoT and Broadcast, making it the ideal choice for testing high-end MCUs and SoCs with embedded RF functionality.

Unique features of the HDRF2 include:

  • Up to 4 VSTs (Vector Signal Transceivers): Enhances test flexibility and accuracy.
  • Up to 32 Ports: Supports a wide range of connection needs for more comprehensive testing.
  • Direct Mount Connection: Improves test accuracy and eliminates RF test distortion and interference issues, enabling quick and seamless setup.
  • Simple and Convenient Operation: Enables rapid deployment for mass production, saving customers valuable time and costs.
  • Outstanding High-Frequency Characteristics and Stability: Easily handles a variety of complex test environments.
  • Compatible with Multiple 3680 High-Precision Boards (HDAVO High-Precision ADC/DAC, etc.): Provides comprehensive solutions for even the most complex functional testing challenges.

▲3680 Advanced SoC Test System + HDRF2 RF Test Board

Chroma is committed to advancing excellence and helping customers achieve efficient, accurate, and reliable testing processes. In RF-related testing applications, the Chroma 3680 Advanced SoC Test System combined with the HDRF2 RF Test Board enables customers to achieve the breakthroughs they need to stand out in this highly competitive market.


Wireless & RF Function Board HDRF2


Chroma 3680 Advanced SoC Test System