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SoC Test System
SoC/Analog Test System
Model 3650-S2
- 12 Universal slots for digital, analog and mixed-signal applications
- Up to 768 digital I/O and analog pins
- 50 / 100 MHz clock rate
- 100 / 200 Mbps (MUX) data rate
Advanced SoC/Analog Test System
Model 3680
- 24 interchangeable slots for digital, analog and mixed-signal applications
- 150 Mbps up to 1Gbps data rate (muxed)
- Up to 512 sites parallel test
- Up to 2048 digital I/O pins
Advanced SoC/Analog Test System
Model 3650
- Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
- Expandable platform with up to 640 channels
- 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
- Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
Advanced SoC/Analog Test System
Model 3650-EX
- Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
- Expandable platform with up to 1024 IO channels and 96 DPS
- 50/100 MHz, 200 MHz (MUX) Test Rate
- Varieties of high density options include VI45, PVI100, HDADDA and MRX
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