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Along the rapid development of technologies like 5G and AIoT, semiconductor devices now contain ever more functionalities, using "system in a package" and "heterogeneous integrated package" methods to run at higher speed with more connection pins. Chroma's semiconductor test solutions address all the needs of SoC by offering various specific functions, such as high-speed digital testing, high performance power source, high fidelity and low noise mixed signal testing, CMOS image sensor testing, as well as true wireless stereo and radio frequency testing. Chroma has also developed series of PXIe instruments and software, leveraging the benefits of PXIe's size and flexibility to drive all your semiconductor innovations.
SoC Test System
SoC/Analog Test System
Model 3650-S2
- 12 Universal slots for digital, analog and mixed-signal applications
- Up to 768 digital I/O and analog pins
- 50 / 100 MHz clock rate
- 100 / 200 Mbps (MUX) data rate
Advanced SoC Test System
Model 3680
- 24 interchangeable slots for digital, analog and mixed-signal applications
- Data rate up to 1Gbps
- Up to 2048 sites parallel test
- Up to 2048 digital I/O pins
Advanced SoC/Analog Test System
Model 3650
- Application coverage: PMIC, ADDA/Memory, Controller, MCU, and all sorts of consumer
- Expandable platform with up to 640 channels
- 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
- Varieties of high density options, ranging from analog, ADDA, mixed-signal, to TIA
Advanced SoC/Analog Test System
Model 3650-EX
- Application coverage: MCU, ADDA/Memory, Controller, PMIC, and all sorts of consumer
- Expandable platform with up to 1024 IO channels and 96 DPS
- 50/100 MHz, 200 MHz (MUX) Test Rate
- Varieties of high density options include VI45, PVI100, HDADDA and MRX
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