Quick Menu

InductorTest&PackingMachine
  • CE Mark
Inductor Test & Packing Machine
Model 1870D
  • Automated Production for Power Inductors
  • Test and packing speeds from 80ppm to1,800ppm
InductorLayerShortATS 
  • CE Mark
Inductor Layer Short ATS 
Model 1871
Test and packing speeds from 600ppm to 1500ppm
MagneticComponentTestSystem
Magnetic Component Test System
Model 1810
  • Test frequency: 20kHz~1MHz
  • Multiple modules for different voltage and current output
  • DC bias current: up to 60A
  • Windows based software for electrical characteristic analysis
ComponentAutomaticTestSystem
  • CE Mark
Component Automatic Test System
Model 8800
  • Support instruments with GPIB, RS-232, or RS-485 I/F
  • Windows based software with open architecture
  • Test items and test programs editable by users
  • Comprehensive analyzing tools for report generating
ElectricalDoubleLayerCapacitorATS(EDLCATS)
Electrical Double Layer Capacitor ATS (EDLC ATS)
Model 8801
  • Measurement function: C, IR, and ESR
  • 10ch scanner for reducing test time
  • Windows based software with open architecture
EDLCLCMonitoringSystem
EDLC LC Monitoring System
Model 8802
  • Modular design with 20ch leakage current monitoring boxes
  • Up to 200ch with 10 boxes per system
  • Windows based software for controlling multiple systems
CapacitorTestSystem
Capacitor Test System
Model 1820
  • High frequency sine wave current: 1kHz~20kHz, 10kHz~200kHz
  • DC bias voltage: 5000V max.
  • Capacitor endurance & temperature rising test
  • Capacitor withstanding current test (frequency sweep)
  • Support with software control
  • Customized test module