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Chroma's IC test and handler solutions assure that the IC packaging meets the original design specifications and verify the performance of the IC before it is assembled in the electronic product. The pick-and-place IC handler can be used in the system-level test and final test for all sorts of ICs. Working with a tri-temp controller enables simulation of use in a harsh environment under extremely low and high temperatures. Combined with various automated designs, Chroma's IC handler can meet all your testing needs. Chroma Virtual Operation Tools can remotely monitor the test process, predict the handler's test efficiency through big data, and improve your product's test yield.

IC Pick & Place Handler

HybridSingleSiteTestHandler Model3110
Hybrid Single Site Test Handler
Model 3110
  • Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) 
  • FT+SLT Handler (Two In One)
  • Perfect for Device Engineering Characterization Gathering and Analysis
  • Auto Tray Load/unload & Device Sorting capability
  • Tester Zero waiting time
FullRangeActiveThermalControlHandler Model3110-FT
  • CE Mark
Full Range Active Thermal Control Handler
Model 3110-FT
  • Temperature Test from -40~125℃
  • Final Test or System Level Test
  • 3x3mm~45x45mm Package
TabletopSingleSiteTestHandler Model3111
  • CE Mark
Tabletop Single Site Test Handler
Model 3111
  • Tabletop design for smaller table space 60 cm2
  • (2) Fixed JEDEC trays
  • IC package size ranges: 5x5mm to 45x45mm
  • Software configurable binning
RFSolutionIntegratedHandler  Model3240-Q
RF Solution Integrated Handler 
Model 3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
DieTestHandler Model3112
Die Test Handler
Model 3112
  • Reliable Pick&Place bare die test handler
  • Multi-plate input and automated test sorting capability
  • Omni-directional adjustable probe stage (X/Y/Z/θ)
  • Stage remain die check function
Tri-TempOctalSitesHandler 3160-C
  • CE Mark
  • Taiwan Excellence 2018
Tri-Temp Octal Sites Handler
  • Advance thermal technology (Nitro TEC)
  • Faster index time 0.6 sec
  • Active thermal control and full range temperature
  • Chamber less design
OctalSiteTestHandler Model3180
  • CE Mark
Octal Site Test Handler
Model 3180
  • Up to x8 parallel test sites
  • Up to 9000 UPH
  • Temperature test from ambient ~150℃
AutomaticSystemFunctionTester Model3240
Automatic System Function Tester
Model 3240
  • Innovative handler for high volume/multi-site IC testing at system level.
  • Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.
AutomaticSystemFunctionTester Model3260
Automatic System Function Tester
Model 3260
  • Innovative handler for high volume/multi-site IC testing at system level.
  • Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.
MiniatureICHandler  Model3270
Miniature IC Handler 
Model 3270
Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level.
CobraTemperatureForcingSystemforATE/SLTTestApplications Model31000R
Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R
  • Temperature range of -40°C to 150°C
  • Compact footprint
  • Self-contained – No external chiller required
  • Liquid-free Operation