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FullRangeActiveThermalControlHandler
  • CE Mark
Full Range Active Thermal Control Handler
Model 3110-FT
  • Temperature Test from -40~125℃
  • Final Test or System Level Test
  • 3x3mm~45x45mm Package
TabletopSingleSiteTestHandler
  • CE Mark
Tabletop Single Site Test Handler
Model 3111
  • Tabletop design for smaller table space 60 cm2
  • (2) Fixed JEDEC trays
  • IC package size ranges: 5x5mm to 45x45mm
  • Software configurable binning
RFSolutionIntegratedHandler 
RF Solution Integrated Handler 
Model 3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
Tri-TempOctalSitesHandler
  • CE Mark
  • Taiwan Excellence
Tri-Temp Octal Sites Handler
3160-C
  • Advance thermal technology (Nitro TEC)
  • Faster index time 0.6 sec
  • Active thermal control and full range temperature
  • Chamber less design
OctalSiteTestHandler
  • CE Mark
Octal Site Test Handler
Model 3180
  • Up to x8 parallel test sites
  • Up to 9000 UPH
  • Temperature test from ambient ~150℃
HybridSingleSiteTestHandler
Hybrid Single Site Test Handler
Model 3110
  • Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) 
  • FT+SLT Handler (Two In One)
  • Perfect for Device Engineering Characterization Gathering and Analysis
  • Auto Tray Load/unload & Device Sorting capability
  • Tester Zero waiting time
DieTestHandler
Die Test Handler
Model 3112
  • Reliable Pick&Place bare die test handler
  • Multi-plate input and automated test sorting capability
  • Omni-directional adjustable probe stage (X/Y/Z/θ)
  • Stage remain die check function
AutomaticSystemFunctionTester
Automatic System Function Tester
Model 3240
Innovative handler for high volume/multi-site IC testing at system level. Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.
AutomaticSystemFunctionTester
Automatic System Function Tester
Model 3260
Innovative handler for high volume/multi-site IC testing at system level. Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.
MiniatureICHandler 
Miniature IC Handler 
Model 3270
Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level.
CobraTemperatureForcingSystemforATE/SLTTestApplications
Cobra Temperature Forcing System for ATE/SLT Test Applications
Model 31000R
  • Temperature range of -40°C to 150°C
  • Compact footprint
  • Self-contained – No external chiller required
  • Liquid-free Operation