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Gallery View List View IC Pick & Place Handler Hybrid Single Site Test HandlerModel 3110 Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) FT+SLT Handler (Two In One) Perfect for Device Engineering Characterization Gathering and Analysis Auto Tray Load/unload & Device Sorting capability Tester Zero waiting time Add to Inquiry Cart Full Range Active Thermal Control HandlerModel 3110-FT Temperature Test from -40~125℃ Final Test or System Level Test 3x3mm~45x45mm Package Add to Inquiry Cart Tabletop Single Site Test HandlerModel 3111 Tabletop design for smaller table space 60 cm2 (2) Fixed JEDEC trays IC package size ranges: 5x5mm to 45x45mm Software configurable binning Add to Inquiry Cart RF Solution Integrated Handler Model 3240-Q The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber. Add to Inquiry Cart Die Test HandlerModel 3112 Reliable Pick&Place bare die test handler Multi-plate input and automated test sorting capability Omni-directional adjustable probe stage (X/Y/Z/θ) Stage remain die check function Add to Inquiry Cart Tri-Temp Octal Sites Handler3160-C Advance thermal technology (Nitro TEC) Faster index time 0.6 sec Active thermal control and full range temperature Chamber less design Add to Inquiry Cart Octal Site Test HandlerModel 3180 Up to x8 parallel test sites Up to 9000 UPH Temperature test from ambient ~150℃ Add to Inquiry Cart Automatic System Function TesterModel 3240 Innovative handler for high volume/multi-site IC testing at system level. Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C. Add to Inquiry Cart Automatic System Function TesterModel 3260 Innovative handler for high volume/multi-site IC testing at system level. Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C. Add to Inquiry Cart Miniature IC Handler Model 3270 Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level. Add to Inquiry Cart Cobra Temperature Forcing System for ATE/SLT Test ApplicationsModel 31000R Temperature range of -40°C to 150°C Compact footprint Self-contained – No external chiller required Liquid-free Operation Add to Inquiry Cart
Gallery View List View IC Pick & Place Handler Hybrid Single Site Test HandlerModel 3110 Optional Tri-temp IC test function (Standard: -40℃~135℃, Option: -55℃~150℃) FT+SLT Handler (Two In One) Perfect for Device Engineering Characterization Gathering and Analysis Auto Tray Load/unload & Device Sorting capability Tester Zero waiting time Add to Inquiry Cart Full Range Active Thermal Control HandlerModel 3110-FT Temperature Test from -40~125℃ Final Test or System Level Test 3x3mm~45x45mm Package Add to Inquiry Cart Tabletop Single Site Test HandlerModel 3111 Tabletop design for smaller table space 60 cm2 (2) Fixed JEDEC trays IC package size ranges: 5x5mm to 45x45mm Software configurable binning Add to Inquiry Cart RF Solution Integrated Handler Model 3240-Q The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber. Add to Inquiry Cart Die Test HandlerModel 3112 Reliable Pick&Place bare die test handler Multi-plate input and automated test sorting capability Omni-directional adjustable probe stage (X/Y/Z/θ) Stage remain die check function Add to Inquiry Cart Tri-Temp Octal Sites Handler3160-C Advance thermal technology (Nitro TEC) Faster index time 0.6 sec Active thermal control and full range temperature Chamber less design Add to Inquiry Cart Octal Site Test HandlerModel 3180 Up to x8 parallel test sites Up to 9000 UPH Temperature test from ambient ~150℃ Add to Inquiry Cart Automatic System Function TesterModel 3240 Innovative handler for high volume/multi-site IC testing at system level. Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C. Add to Inquiry Cart Automatic System Function TesterModel 3260 Innovative handler for high volume/multi-site IC testing at system level. Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C. Add to Inquiry Cart Miniature IC Handler Model 3270 Innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level. Add to Inquiry Cart Cobra Temperature Forcing System for ATE/SLT Test ApplicationsModel 31000R Temperature range of -40°C to 150°C Compact footprint Self-contained – No external chiller required Liquid-free Operation Add to Inquiry Cart