Quick Menu

SemiconductorAdvancedPackagingOpticalMetrologySystem Model7505Series
Semiconductor Advanced Packaging Optical Metrology System
Model 7505 Series
The system uses white light interference measurement technique to perform nondestructive and rapid surface profile measurement and analysis, which is suitable for 12" wafer.
WaferChipInspectionSystem Model7940
Wafer Chip Inspection System
Model 7940
  • Simultaneous double side color inspection
  • 6" wafer/8" inspection area
  • Automatic wafer alignment
  • Wafer shape/edge identification
3DOpticalProfiler Model7503
3D Optical Profiler
Model 7503
  • Use white light interference measurement technique
  • Modulized design
  • Various surface measurement parameters, such as sectional difference, included angle, area, dimension, roughness, waviness, film thickness and flatness
Multi-FunctionalOpticalMeasuringSystem Model7505-05
Multi-Functional Optical Measuring System
Model 7505-05
  • Applies to Mobile phone cosmetic, battery, CG quality testing
  • Integrated with 2D & 3D measurement in one system
  • Tunnel measurement design for High measurement speed
  • Provide immediate histogram to show the quality of each test items immediately
CylindricalBatteryCellAutomatedOpticalInspectionSystem Model7505-K006
Cylindrical Battery Cell Automated Optical Inspection System
Model 7505-K006
Applies to various cylindrical battery sizes on the mainstream market.
ThinFilmThicknessAutomatedOpticalMetrologySystem Model7505-K007
Thin Film Thickness Automated Optical Metrology System
Model 7505-K007
Applies to Roll to Roll processing and thin film thickness inspection.
Multi-FunctionalOpticalProfilingSystem Model7505-01
Multi-Functional Optical Profiling System
Model 7505-01
  • 1D, 2D and 3D measurement capabilities
  • Equipped with film measurement function (1D) to do non-destructive film thickness measurement when penetrating reflection measurement is in use
  • Perform 2D defect measurement via high resolution line scan camera to check for bubbles, scratches and foreign objects
  • Use white light interferometry to perform 3D Profile measurement
InlineAOIsystem Model7505-02
Inline AOI system
Model 7505-02
  • For ITO (Indium Tin Oxide)Thin-film, RFID and FPC Roll to Roll process online real-time automatic optical inspection 
  • Equipped with high resolution line scan camera, has capabilities of detecting defects, like bubbles, scratches and so on.
  • Use multi-line camera to acquire images in the same time. High testing speed.
  • Equipped with positioning target recognition function and defect map function
MiniLEDBacklightModuleAutomaticOpticalTestSystem Model7661-K003
Mini LED Backlight Module Automatic Optical Test System
Model 7661-K003
  • Integrated 71803-2 2D Color Analyzer executes brightness, color, and defect analysis on Mini LED
  • Test items: chromaticity, brightness, luminous intensity, uniformity, voltage, current, and dead lights
  • Optional Chroma LED power tester and optical module allow integration into a test system