Chroma AOI System

Automated optical inspection uses machine vision inspection technology to perform high-speed and high-precision optical image verification and replace time-consuming and unstable manual visual inspection. Chroma offers AOI solutions that are equipped with high-resolution optical imaging, multi-functional light sources, and in-house developed white light interferometry. Combining innovative algorithms and AI analysis, the AOI solutions can perform accurate and reliable defect detection, color analysis, and sub-nano 3D profile measurement when integrated into a high-speed automated production line. Chroma's AOI solutions are the best choice to ensure your production quality.

AOI System

In-process Wafer Inspection System
Model 7945

Double side inspection (post-diced wafer)
Full color defect detection
Fast multi-computer image processing
Shared auto wafer loader

2D/3D Wafer Metrology System
Model 7980

Chroma 7980 2D/3D Wafer Metrology System is powered by patented BLiS^TM technology to provide nanoscale nondestructive and rapid surface profile measurement and analysis. The system is suitable for up to 12" wafer with EFEM and SECS/GEM.

3D Optical Profiler
Model 7503

Use white light interference measurement technique
Modulized design
Various surface measurement parameters, such as sectional difference, included angle, area, dimension, roughness, waviness, film thickness and flatness

Wafer Chip Inspection System
Model 7940

Simultaneous double side color inspection
6" wafer/8" inspection area
Automatic wafer alignment
Wafer shape/edge identification

Multi-Functional Optical Measuring System
Model 7505-05

Applies to Mobile phone cosmetic, battery, CG quality testing
Integrated with 2D & 3D measurement in one system
Tunnel measurement design for High measurement speed
Provide immediate histogram to show the quality of each test items immediately

CylindricalBatteryCellAutomatedOpticalInspectionSystem Model7505-K006

1D, 2D and 3D measurement capabilities
Equipped with film measurement function (1D) to do non-destructive film thickness measurement when penetrating reflection measurement is in use
Perform 2D defect measurement via high resolution line scan camera to check for bubbles, scratches and foreign objects
Use white light interferometry to perform 3D Profile measurement

Inline AOI system
Model 7505-02

For ITO (Indium Tin Oxide)Thin-film, RFID and FPC Roll to Roll process online real-time automatic optical inspection
Equipped with high resolution line scan camera, has capabilities of detecting defects, like bubbles, scratches and so on.
Use multi-line camera to acquire images in the same time. High testing speed.
Equipped with positioning target recognition function and defect map function

Mini LED Backlight Module Automatic Optical Test System
Model 7661-K003

Integrated 71803-2 2D Color Analyzer executes brightness, color, and defect analysis on Mini LED
Test items: chromaticity, brightness, luminous intensity, uniformity, voltage, current, and dead lights
Optional Chroma LED power tester and optical module allow integration into a test system