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Wafer Level Test

In-processWaferInspectionSystem Model7945
  • CE Mark
In-process Wafer Inspection System
Model 7945
  • Double side inspection (post-diced wafer)
  • Full color defect detection
  • Fast multi-computer image processing
  • Shared auto wafer loader
ShortPulsePhotonicsDeviceProbingTestSystem Model58636Series
Short Pulse Photonics Device Probing Test System
Model 58636 Series
  • Nanosecond-scale pulse driving and measurement
  • Drive heterogeneous integration samples like VoS (VCSEL on System), and VoD (VCSEL on Driver) with digital control
  • Patented two-in-one optical head design fetches all LIV (Light-Current-Voltage), wavelength, and near-field optics analysis data in one touchdown
  • Multi-site and multi-die support enhance test efficiency
PhotonicsWaferProbingTestSystem Model58635Series
Photonics Wafer Probing Test System
Model 58635 Series
  • Up to 6" wafer
  • Support both QCW and CW operation
  • LIV test, Near Field test, Far Field test, LIV-λ & NF two-in-one test
WaferChipInspectionSystem Model7940
Wafer Chip Inspection System
Model 7940
  • Simultaneous double side color inspection
  • 6" wafer/8" inspection area
  • Automatic wafer alignment
  • Wafer shape/edge identification