Model
3360
VLSI Test System
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Key Features
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- 50 MHz Test Rate(100Mhz HSCLK)
- 608 I/O channels
- 8~16 M Pattern Memory
- Flexible Configuration (Interchangeable I/O, UVI, ADDA and LCD)
- Parallel Testing for 32 devices
- Real Parallel Trim/Match function
- Accepts SC312, TS670 probe card
- Test program/pattern converter (V7, TRI6020, V50, SC312, J750, ITS9K, TS670, ND1)
- Analog PE card option (16 bit~24bit)
- SCAN test option (512M)
- ALPG test option for Memory
- STDF tools support
- User friendly Windows XP environment
- CRAFT C/C++ programming language
- Real time pattern editor with fail pin/fail address display
- Versatile test analysis tools: Shmoo plot, Waveform display, Wafer Map, Pin Margin, Scope tool,Histogram tool and etc.
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Most Flexible Configuration for Various Devices (Logic, LCD, LED, ADDA, ALPG, SCAN, Power and etc.)
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Request a quote.
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All specifications are subject to change without notice
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