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Photovoltaic Test & Automation Solution
Inspection System
Automatic Optical Inspection System
c-Si Solar Cell Tester
DC Power Supply
Digital Power Meter/Analyzer
AC Power Source
AC Electronic Load
Automatic Test System (ATS)
Electrical Safety Analyzer
Model 3710 Solar Wafer Inspection System

Key Features Previous | Back to List | Next
  • Good for 5 inches and 6 inches wafer
  • High throughput and low breakage rate ≤0.2%
  • 2D Geometry Inspection
  • Surface Inspection
  • Micro Crack Inspection
  • Saw Mark Inspection
  • Resistively/ Thickness Tester
  • Lifetime Tester
  • Easy trouble shooting
  • Loader : Coin stack / Cassette
  • Unload : Coin stack / Cassette
Solar Wafer Inspection System

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Integrated with 2D Geometry, Surface, Micro Crack, Saw mark inspection system and Resistively & Thickness, Lifetime tester by customer defined,

Chroma 3710 is a fully user configuration wafer sorter system with very low breakage rate and high throughput.Chroma 3710 solar wafer inspection system is ideal for PV incoming process. Plus wafer can be sorted by user defined algorithm fully automatically into coin stack or cassette. The unique auto coin stack/cassette exchange feature eliminates system down time when changing full coin stack/cassette to empty coin stack/cassette manually.

For the breakage rate that is one of the key concern for PV wafer handling system. Chroma 3710 uses state-of-the-art cell transportation technique to ensure minimum breakage rate. Loading Auto-unloading Manual-unloading.


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Model Description Inquiry
3710 Solar Wafer Inspection System
All specifications are subject to change without notice