Automatic System Function Tester Model 3240

Key Features
  • Reliable high-speed pick & place handler
  • Tester zero waiting time
  • Gull wing package capability
  • No socket damage
  • Air damper for contact balance
  • IC-in-socket protection
  • NS-5000/6000 change kits compatible

Chroma 3240 is an innovative handler for high volume/multi-site IC testing at system level. It is capable of handling packages of various types including QFP, TQFP, BGA, PGA, etc. The handler uses pick and place technology to pick up devices from JEDEC trays, move them to the test site, then move them to the appropriate bin after test. It features a 90-degree device rotation which is required for various pin one orientations.

Chroma 3240 can test up to 4 devices in parallel at high temperature with ATC (Auto Temperature Cooling) ranging from 50˚C to 125˚C.

Product Inquiry

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All specifications are subject to change without notice.

Automatic System Function Tester