Dear Sir/Madam,

It is our honor to invite you to visit CIOE 2017. This event will be held at the Shenzhen Convention & Exhibition Center, from 6th (Wed.) to 9th (Sat.) in September, 2017. Chroma's booth will be located at Hall 2 Booth:2L28.

In this event, Chroma will introduce newly developed test solutions as following:

Optical Devices Test Solution :
TO-CAN Package Inspection System
Wafer Chip Inspection System
TO CAN/CoC Burn-In System
Laser Diode Characterization System
VCSEL Mapping Prober
TOSA/BOSA Temperature Control System

Of course, there are more Optical Devices Test Solution which we may offer to fulfill your special test requirement. Again, with great enthusiasm, Chroma welcomes you to attend this event and visit our booth. We believe you will have new findings and pleasant experience talking with us.

We are looking forward to seeing you soon!

CHROMA ATE INC.