Empowering next-generation advanced packaging and heterogeneous integration with AI-enhanced test intelligence.

The Chroma 3680 represents a new era of Automatic Test Equipment (ATE), where hardware innovation meets AI-driven software intelligence. Designed for the demands of modern semiconductor testing, it addresses long-standing challenges such as test program portability, debug efficiency, and high-mix device support—all within a unified and intelligent platform.

AI-Powered Software for Seamless Program Portability

Test program migration across ATE platforms is a notorious bottleneck, often requiring weeks of manual rework due to differences in test languages, pattern formats, and timing models. With the integration of CRISPro—Chroma's Windows-based software platform—Chroma 3680 solves this problem by using advanced AI techniques including large language models (LLMs) and retrieval-augmented generation (RAG).

CRISPro understands both the syntax and semantics of test scripts, enabling it to intelligently convert patterns, timing sets, and pin configurations across platforms. Unlike static converters, it references a curated knowledge base of historical conversions, allowing for highly accurate and context-aware conversion processes. Pilot deployments show over 80% reduction in engineering effort during program migration.

Automated Debug and Data-Driven Optimization

CRISPro goes beyond conversion. During characterization and validation, it analyzes test data such as Shmoo plots to identify marginal regions and failure signatures. Based on this, it can suggest timing adjustments, retarget problematic vectors, or even generate new debug-specific test patterns. This intelligent feedback loop significantly accelerates debug cycles and improves first-pass yield.

Integrated RF Testing with HDRF2 Card

For wireless and high-frequency ICs, Chroma introduces the HDRF2 test card—the most internally integrated RF engine available among all ATE systems. Engineered to complement the 3680 platform, HDRF2's one-click engagement eliminates the need for manual cabling, reducing setup complexity and operator error.

More importantly, it removes the need for time-consuming calibration with each setup. Calibration data is stored with the load board and automatically applied during engagement. This ensures faster bring-up, improved repeatability, and higher throughput for RF devices such as Bluetooth or Wi-Fi chips.

Modular, Scalable, and Engineer-Friendly

Engineers benefit from a modular, Windows-native environment that supports real-time visualization, workflow customization, and third-party tool integration. Whether for waveform correlation, pattern analysis, or debug scripting, CRISPro provides an intuitive yet powerful interface for all test development needs.

The Future of Intelligent Test Begins with Chroma 3680

As ICs become more heterogeneous—integrating analog, digital, RF, and memory components—ATE systems must evolve beyond static execution. Chroma 3680 delivers this evolution by combining robust instrumentation, seamless RF integration, and AI-enhanced software capabilities into a single, production-ready platform.

With proven gains in portability, debug automation, and RF handling, Chroma 3680 is redefining what's possible in semiconductor test engineering—and setting the standard for the next generation of intelligent ATE systems.

Experience smarter testing with Chroma 3680.
Get in touch to explore how we can support your next breakthrough.