VLSI Test System Model 3380D

Key Features
  • 50/100 MHz clock rate
  • 50/100 Mbps data rate
  • 1024 I/O pins (max. 1280 I/O pins)
  • Up to 1024 sites parallel testing
  • 32/64/128 pattern memory
  • 16M capture memory per pin
  • Various VI source
  • Flexible hardware architecture (interchangeable I/O, VI, ADDA,)
  • Real parallel trim/match function
  • Time and frequency measurement unit (TFMU)
  • STDF tools support
  • Test program/pattern converter (J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.)
  • AD/DA test (option)
  • SCAN test option (max. 2G M/chain)
  • ALPG test option for embedded memory
  • CRAFT C/C++ programming language
  • Software interface same as 3380P/3360P
  • User-friendly Windows 7 environment

In order to cope with the IC testing trend of highspeed, numerous pins and complex functions in the future, the newest generation of Chroma's VLSI testers, 3380D/3380P/3380, have adopted a more flexible architecture with higher integration density and powerful functions.

The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.

The test systems also have built in DC power rack design to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.

The 3380D will be ideally for IoT applications, especially for those cost sensitive devices such as MCU, MEMS, and MCU with integrated functions. The VLSI test systems, including the 3380D/3380P/3380 series, have been widely adopted in China market.

 Full Applications to meet veried ICs

Such as Logic, ADDA, RF(MCU), LED, Power, ALPG, Match, etc.

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All specifications are subject to change without notice.

VLSI Test System