In order to cope with the IC testing trend of high-speed, numerous pins and complex functions in the future, the newest generation of Chroma's VLSI test systems, 3380D/3380P/3380, have adopted a more flexible architecture with higher integration density and powerful functions.
The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
The test system 3380P also has built in all-in-one design (for test head only) to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.
Rich Functions and Wide Coverage
Logic, MCU, ADDA (Mixed-signal) ; Power, LED driver, Class D ; SCAN, ALPG, Match and etc.